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Efficient together!
Complete solution for testing & programming electronic assemblies
JTAG stand-alone system BARCUDA
Time for change!
Exchange your 2D AOI to 3D AOI.
https://www.goepel.com/en/news/read/aufruestung-vom-2d-zum-3d-aoi-system.html
With watchful eyes
Video Dragon as Frame Grabber and Generator for ADAS applications
LVDS - Low Voltage Differential Signaling

GÖPEL electronic is a leading provider of innovative test and inspection solutions for printed circuit board assemblies (PCBAs) and electronic devices and systems.

Page 21 of 22.

Boris Opfer (left, SYSTECH Europe) and Alexander Beck (right, GÖPEL electronic) implement the integration of the Boundary Scan in the Flying Probe Test system APT-1400F

11/07/2016 | Embedded JTAG Solutions

Combined test methods: JTAG/Boundary Scan available for Flying Prober Testers from TAKAYA

10/05/2016 | Embedded JTAG Solutions

Improved Production Throughput in SPEA Flying Probe Systems through Extension of Boundary Scan Integration

High volume automotive assemblies with THT, BGA, QFN and DPAK components

09/21/2016 | AXI

IPC Compliant THT Solder Joint Inspection of Automotive Connectors

09/21/2016 | Embedded JTAG Solutions

3D AOI redefined: GOEPEL electronic presents new 2D/3D camera module and other test and inspection solutions at electronica 2016

09/07/2016 | Embedded JTAG Solutions

Extension of ChipVORX Technology for Chip Embedded Instruments on Altera Arria V SoC Series

09/02/2016 | Embedded JTAG Solutions

GOEPEL electronic expands Test and Emulation on Bluetooth SoC Controller of Nordic Semiconductor

Page 21 of 22.

15. Feb '21 08:00 - 09:30 CET
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Embedded JTAG Solutions
Inspection Solutions
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Web Seminar
Test Convention connect

Test Convention connect - Artificial Intelligence

16. Feb '21 08:00 - 09:30 CET
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Embedded JTAG Solutions
|
Web Seminar
Test Convention connect

Test Convention connect - Embedded JTAG Solutions

17. Feb '21 08:00 - 09:30 CET
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Embedded JTAG Solutions
|
Web Seminar
Test Convention connect

Test Convention connect - Visual Project Explorer

22. Feb '21 08:00 - 09:00 CET
|
Embedded JTAG Solutions
Inspection Solutions
|
Web Seminar
Test Convention connect

GÖPEL electronic

Enjoy Testing!

Latest news from GÖPEL electronic

Combined test methods: JTAG/Boundary Scan available for Flying Prober Testers from TAKAYA

Improved Production Throughput in SPEA Flying Probe Systems through Extension of Boundary Scan Integration

IPC Compliant THT Solder Joint Inspection of Automotive Connectors

3D AOI redefined: GOEPEL electronic presents new 2D/3D camera module and other test and inspection solutions at electronica 2016

Extension of ChipVORX Technology for Chip Embedded Instruments on Altera Arria V SoC Series

GOEPEL electronic expands Test and Emulation on Bluetooth SoC Controller of Nordic Semiconductor

Events

Test Convention connect - Artificial Intelligence

Test Convention connect - Embedded JTAG Solutions

Test Convention connect - Visual Project Explorer

Test Convention connect - Artificial Intelligence