Test and programming solutions for embedded electronics of the future

Embedded JTAG Solutions based on the multi-functional JTAG platform

GOEPEL electronic will be presenting its Embedded JTAG Solutions at the embedded world 2017 trade fair. This will involve showcasing a strategy which includes complete coverage of test and programming technologies using the multifunctional JTAG platform: Embedded Board Test, Embedded Functional Test and Embedded Programming. These high-performance individual technologies provide users with a range of new test and programming solutions for the electronics of the future.

Embedded Board Test combines test methods for complex electronics. These test methods utilise the intelligence of in-built circuits. Various different technologies are used here, all with one thing in common: the test scenarios are generated and used in a single system. Typical manufacturing faults - such as short circuits, missing resistors, lack of solder on pins and BGA balls, as well as errors in high-speed data transmission - can therefore be found quickly and efficiently. The short implementation time and accurate error diagnostics enable cost-effective repair.

Functional testing of modern electronics utilising the intelligence of modules that are already populated is implemented with the Embedded Functional Test. This makes it possible to integrate functional tests such as access to I²C and SPI modules, measurement and evaluation of analogue processor inputs, dynamic memory tests and even testing of high-speed interfaces such as USB 3.0. Unlike traditional functional tests, no board-specific firmware is required.

The idea behind embedded programming is to provide a single solution for all programming requirements in modern electronics - regardless of whether they are used in development or in production. These days, a universal programming system must support multiple scenarios; in on-board programming, a distinction is drawn once again between programming serial Flash modules (I²C, SPI) and programming parallel Flash modules (NOR, NAND). In addition, more and more data must be written to the on-chip Flash. These are often processors, controllers or even FPGAs. In production, there is often the desire to implement these programming requirements on several boards in parallel.

Test and programming solutions for embedded electronics of the future

Test and programming solutions for embedded electronics of the future

Created by Matthias Müller | | Embedded JTAG Solutions Debugging Programming
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