SCANFLEX II CUBE: New Generation JTAG/Boundary Scan Controller

Higher Test Depth With Less Use of External Test Hardware

GOEPEL electronic presents SCANFLEX II CUBE, the new generation of modular JTAG/Boundary Scan controllers.  Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. This test and validation method uses embedded instruments to test and program complex boards. This results in a high test depth with less use of external test hardware.

The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform. Embedded Board Test offers the advantage of a significantly improved test depth for complex boards even without the need for needles. For example, an Embedded Functional Test can be implemented while Embedded Programming makes external programmers unnecessary.

Eight independent, parallel test access ports (TAPs) for up to 100MHz enable synchronized execution of test, debug and programming operations via Embedded JTAG Solutions (Boundary Scan, Processor Emulation, Chip Embedded Instruments). SCANFLEX II CUBE can be controlled via USB 3.0 and Gbit LAN.



Created by Matthias Müller | | Embedded JTAG Solutions Programming SCANFLEX

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