New JTAG/Boundary Scan controller for large-scale testing and programming
Simultaneous testing and programming in electronics production
Parallel operation is indispensable for testing and subsequently programming a large number of electronic assemblies in production. The new JTAG/Boundary Scan Controller SFX II BLADE 8 RMx1/2 offers up to two times eight TAPs (Test Access Ports). This allows several different or identical assemblies to be processed simultaneously, resulting in an increase in throughput.
The SCANFLEX II BLADE 8 RMx1/2 is a product series of a JTAG/Boundary Scan controller generation within the SCANFLEX II architecture. Based on multi-core processors and FPGA, these controllers form the basis for supporting Embedded JTAG Solutions. Those are test and validation methods that use the functions of FPGAs and processors to test and program complex boards with greatly reduced physical access. The SCANFLEX II BLADE 8 RMxX offers a uniform control platform with 1 x 8 or 2 x 8 independent, true parallel Test Access Ports (TAP) for up to 100MHz, as well as 1 or 2 programmable, multifunctional 64 channel I/O mixed-signal units. The controllers are directly designed as 19" 1U chassis. Depending on the configuration, the SFX II BLADE 8 RMxX contains parallel controllable single and dual solutions. The control interfaces USB3.0 and Gbit LAN are integrated as standard, Wireless LAN is available as an option.
With its multifunctional architecture, the SCANFLEX II BLADE 8 RMx1/2 offers almost unlimited possibilities to combine powerful test and programming technologies with the highest performance on just one platform. With a variety of special extension and configuration features, the SCANFLEX II BLADE 8 RMx1/2 is equipped for standard-level as well as professional and expert-level EJS applications.