Are you ready to overcome the limitations of JTAG/Boundary Scan?
Beyond boundaries
To test electronic assemblies, the JTAG/Boundary Scan test procedure was revolutionary at the time and represented a technological leap. But it was not the possibilities of testing digital components, which were considered an excellent, cost-effective supplement to other test procedures, that made the so-called JTAG test a viable instrument for the future. The true value lies in the limitless possibilities that the standard IEEE 1149 opened up.
The latest JTAG technology - the Embedded JTAG Solutions
The possibilities are so diverse that we call our testing and programming solutions ‘Embedded JTAG Solutions’. They stand on the three pillars of different technology and application areas that you may already know: Embedded Board Test, Embedded Functional Test and Embedded Programming. These three pillars describe concrete application scenarios that may confront you every day in your electronics development or production.
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Embedded JTAG Solutions
Test and programming applications visualised in a JTAG Matrix
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Test and programming applications based on advanced IP technologies
Test and programming applications based on
Boundary Scan (IEEE 1149.x) in interaction with
IP based technologies
Test and programming applications based on Boundary Scan technology (IEEE 1149.x)
Stress
Signal changes take place with exact or higher function speed and deviating parameters of the controlling pin(s).
Nominal-Speed
Signal changes take place at the functional speed of the controlling pin(s).
At-Speed
Signal changes take place below the functional speed of the controlling pin(s)
Static
The signal change runs far below the functional speed of the controlling pin(s).
The test speed is always related to a pin or a pin group and depends on the planned use in the future application.
Embedded Board Test
The Embedded Board Test is used to check functional board connections. For example, short circuits, unsoldered pins or missing pull resistors are detected.
Test and programming applications
based on advanced IP technologies
IP controlled
semi structural test
Test and programming applications based on
Boundary Scan (IEEE 1149.x) in interaction with
IP based technologies
Structural test using a combination of Boundary Scan and IP operations
Test and programming applications based on
Boundary Scan technology (IEEE 1149.x)
Structural and parametric test with Boundary Scan
Embedded Functional Test
In this procedure, we primarily check the DUT and component functions that go beyond simple verification of the connections. In doing so, we use the instruments provided by your DUT.
IP controlled
functional test
Functional test using a combination of Boundary Scan and IP operations
Functional Test with Boundary Scan
Embedded Programming
On-chip or external flash devices are programmed using boundary-scan and hardware resources. In particular, increasing file sizes and the resulting growing demands on programming speed are key elements in today's assembly production.
IP controlled programming of Flash memory and μController
IP controlled programming of Flash memory and μController
Flash memory programming and configuration of (C)PLDs/FPGAs by boundary scan
ultra high speed
High speed to ultra high programming speed
At the Expert level with `IP plus´, the highest programming speeds in the range of GBytes/s are achieved. Here, data can be transferred via fast communication interfaces, such as Ethernet.
Embedded JTAG Solutions
Expert
(IP plus)
Expert (IP plus)
Click here to read more about the Expert Level (IP plus).
High speed
Medium to high programming speed
In the Professional level with Boundary Scan plus, higher programming speeds in the range of kBytes/s are achieved.
Embedded JTAG Solutions
Professional
(Boundary Scan plus)
Professional (Boundary Scan plus)
Click here to read more about the Professional Level (Boundary Scan plus).
Low speed to
medium speed
Low speed to medium
programming speed
In the Standard level with boundary scan, only low programming speeds of few bytes/s to kBytes/s are achieved.
Embedded JTAG Solutions
Standard
(Boundary Scan)
Standard (Boundary Scan)
Click here to read more about the Standard Level (Boundary Scan).
The programming speed depends on the amount of data to be transferred and depends on many factors. Without knowledge of the application, precise statements are therefore generally not possible. Information about the speed is always subjective and depends on the application as well as the benefit.
Low Bytes/sec
Medium KBytes/sec
High MBytes/sec
Ultra High GBytes/sec
The performance levels: Standard, Professional and Expert
These three pillars however, are by no means the entire range of services. This is because we subdivide all three pillars into another three horizontal levels - the performance levels: Standard, Professional and Expert. The lowest ‘Standard’ level describes classic test and programming procedures based on the IEEE 1149.1 Boundary Scan Standard. The Professional and Expert levels are far above this in terms of performance. They use integrated chip resources and enable the highest testing and programming speeds for demanding and complex electronic assemblies.
The resulting matrix provides a complete overview of the Embedded JTAG Solutions and their applications. Behind it are numerous hardware products such as SCANFLEX, SCANBOOSTER or CION as well as the software platform SYSTEM CASCON.
Current article about "Beyond Boundaries"
What exactly "Beyond Boundaries" is all about, which test and programming tasks are possible beyond the boundaries of JTAG/Boundary Scan and the connection between levels, columns and a matrix: the article gives you explanations.