Functional test of modern electronics using the native component intelligence - realised by Embedded Functional Test. The creation and application of test scenarios takes place entirely in a system, which is formed by a common control hardware and a common control software.
Embedded Functional Test allows the integration of functional tests such as access to I²C and SPI components, measurement and evaluation of analog processor inputs, dynamic memory tests and test of high-speed interfaces (e.g. USB 3.0.). Typically these tests are used as an extension to existing structural tests (Boundary Scan, ICT or Flying Probe).
The Embedded Functional Test also detects errors in the dynamic range, which is not possible with purely statistic tests in the usual format. In contrast to the classical function test, no board-specific firmware is required.
- JTAG based test access (Boundary Scan)
FPGA based tests (ChipVORX)
This method integrates the FPGA logic into the test. Even complex test applications are easy and efficient to solve with ChipVORX. Access to internal Gigabit links and other functions (frequency measurement, flash access, RAM tests) is possible via universal FPGA models (no separate adaption necessary).
Processor-based tests (VarioTAP)
A processor-specific model allows the processor to enter the debug mode. With VarioTAP individual functions (analog registers, flash access, real-time RAM tests) are addressed. Both the JTAG port and other debug interfaces are supported.
Processor-based tests with a universal firmware (JEDOS)
Using JEDOS (optimized for test and programming applications), complex function tests with a graphical user interface are achieved. These are complete memory tests, efficient flash access or interfaces tests (Ethernet, USB …). The tests can be created in the shortest possible time without special hardware knowledge.