Today's test strategies require more than just checking signal connections. Testing electronic assemblies is becoming increasingly complex. Diagnosing the failure found presents us with immense challenges. Generating your own firmware for a classic functional test of boards is also time-consuming and complicated.
Functional testing of modern electronics takes place with the help of the intelligence of assembled components on powered assemblies. With the instruments and solutions from GÖPEL electronic, you save time and ensure the quality of your products.
In addition to a flawless connection, board and component function must also be checked. We group these requirements under the term embedded functional test.
The smart function test (Smart FCT) helps to effectively test and program an assembly in a standardised manner immediately after production. This means that failures are detected very early in production and identified with pin accuracy. Ideally, they are also repaired immediately.
Smart FCT enables the integration of functional tests such as
Programmed test functions, known as test IP (intellectual property), are used for testing in FPGAs or processors. Typically, such tests are used in combination with existing structural tests (e.g. boundary scan (IEEE 1149.1)) with the help of this type of software.
In contrast to structural testing, functional testing can also locate failures in the dynamic area, e.g. missing or incorrect termination resistors on RAM modules. And unlike classic functional testing, no board-specific firmware is required.
To ensure absolute error-free operation, classic functional testing is now only performed as a supplementary end-of-line test shortly before delivery. This means that it is greatly reduced to the essential elements and is usually performed with the standard firmware. Smart FCT is typically used for intelligent boards such as control electronics in the range up to 24 V.
The standardized method simply addresses complex components such as FPGAs, processors, controllers and CPLDs. Detailed hardware knowledge is not required.
This method integrates the FPGA logic into the test. Even complex test applications are easy and efficient to solve with ChipVORX. Access to internal Gigabit links and other functions (frequency measurement, flash access, RAM tests) is possible via universal FPGA models (no separate adaption necessary).
A processor-specific model allows the processor to enter the debug mode. With VarioTAP individual functions (analog registers, flash access, real-time RAM tests) are addressed. Both the JTAG port and other debug interfaces are supported.
Using JEDOS (optimized for test and programming applications), complex function tests with a graphical user interface are achieved. These are complete memory tests, efficient flash access or interfaces tests (Ethernet, USB …). The tests can be created in the shortest possible time without special hardware knowledge.
Depending on the target application Embedded Functional Test manages either the JTAG interface with
TCK (Test ClocK),
TMS (Test Mode Select),
TDI (Test Data Input),
TDO (Test Data Output),
TRST (Test ReSeT)
or another debug interface.
Contactez nous !
Free Time finished
Please register now to view the whole webinar.
Not a member yet? click here to register.