Embedded Functional Test (Smart FCT)
Smart functional test of PCBA with pin-accurate failure diagnosis without firmware
Today's test strategies require more than just checking signal connections. Testing electronic assemblies is becoming increasingly complex. Diagnosing the failure found presents us with immense challenges. Generating your own firmware for a classic functional test of boards is also time-consuming and complicated.
Functional testing of modern electronics takes place with the help of the intelligence of assembled components on powered assemblies. With the instruments and solutions from GÖPEL electronic, you save time and ensure the quality of your products.
In addition to a flawless connection, board and component function must also be checked. We group these requirements under the term embedded functional test.
Integration of functional tests such as access to I²C and SPI components
The smart function test (Smart FCT) helps to effectively test and program an assembly in a standardised manner immediately after production. This means that failures are detected very early in production and identified with pin accuracy. Ideally, they are also repaired immediately.
Smart FCT enables the integration of functional tests such as
- RAM connection test
- access to I²C and SPI modules
- measurement and evaluation of analogue processor inputs
- dynamic memory tests
- testing of high-speed interfaces such as Gigabit Ethernet
Programmed test functions, known as test IP (intellectual property), are used for testing in FPGAs or processors. Typically, such tests are used in combination with existing structural tests (e.g. boundary scan (IEEE 1149.1)) with the help of this type of software.
In contrast to structural testing, functional testing can also locate failures in the dynamic area, e.g. missing or incorrect termination resistors on RAM modules. And unlike classic functional testing, no board-specific firmware is required.
To ensure absolute error-free operation, classic functional testing is now only performed as a supplementary end-of-line test shortly before delivery. This means that it is greatly reduced to the essential elements and is usually performed with the standard firmware. Smart FCT is typically used for intelligent boards such as control electronics in the range up to 24 V.
Example applications with Embedded Functional Test
Depending on the target application Embedded Functional Test manages either the JTAG interface with
TCK (Test ClocK),
TMS (Test Mode Select),
TDI (Test Data Input),
TDO (Test Data Output),
TRST (Test ReSeT)
or another debug interface.
Embedded Functional Test with Boundary ScanEvaluation of external ADC for voltage measurement via I2C and boundary scan
Embedded Functional Test via SWDControl of internal instruments via the Serial Wire Debug Interface with SWCLK (Serial Wire CLock) and SWDIO (Serial Wire Digital In/Out)
Embedded Functional Test via JEDOSFunctional ETH loop test (send packets) via internal test function, configuration via JTAG interface
