嵌入式功能测试

The smart function test (Smart FCT) helps to effectively test and program an assembly in a standardised manner immediately after production. This means that failures are detected very early in production and identified with pin accuracy. Ideally, they are also repaired immediately. 

Smart FCT enables the integration of functional tests such as 

• RAM connection test
• access to I²C and SPI modules
• measurement and evaluation of analogue processor inputs
• dynamic memory tests
• testing of high-speed interfaces such as Gigabit Ethernet

Programmed test functions, known as test IP (intellectual property), are used for testing in FPGAs or processors. Typically, such tests are used in combination with existing structural tests (e.g. boundary scan (IEEE 1149.1)) with the help of this type of software.

In contrast to structural testing, functional testing can also locate failures in the dynamic area, e.g. missing or incorrect termination resistors on RAM modules. And unlike classic functional testing, no board-specific firmware is required.

To ensure absolute error-free operation, classic functional testing is now only performed as a supplementary end-of-line test shortly before delivery. This means that it is greatly reduced to the essential elements and is usually performed with the standard firmware. Smart FCT is typically used for intelligent boards such as control electronics in the range up to 24 V.