利用嵌入式功能测试实现的本机组件智能对现代电子产品进行功能测试。测试方案的产生和应用完全发生在一个系统中,该系统由通用控制硬件和通用控制软件组成。
嵌入式功能测试允许集成功能测试,诸如:访问12C和SPI组件、测量与评估模拟处理器输入、动态内存测试和高速接口测试(例如USB3.0)等功能测试。这些测试通常作为现有结构测试(边界扫描、ICT或飞针测试)的扩展被使用。
嵌入式功能测试还可能检测动态范围内的误差,正常情况下这是单纯的统计测试无法实现的。与传统的功能测试相比,该测试不需要特定板固件。
The smart function test (Smart FCT) helps to effectively test and program an assembly in a standardised manner immediately after production. This means that failures are detected very early in production and identified with pin accuracy. Ideally, they are also repaired immediately.
Smart FCT enables the integration of functional tests such as
Programmed test functions, known as test IP (intellectual property), are used for testing in FPGAs or processors. Typically, such tests are used in combination with existing structural tests (e.g. boundary scan (IEEE 1149.1)) with the help of this type of software.
In contrast to structural testing, functional testing can also locate failures in the dynamic area, e.g. missing or incorrect termination resistors on RAM modules. And unlike classic functional testing, no board-specific firmware is required.
To ensure absolute error-free operation, classic functional testing is now only performed as a supplementary end-of-line test shortly before delivery. This means that it is greatly reduced to the essential elements and is usually performed with the standard firmware. Smart FCT is typically used for intelligent boards such as control electronics in the range up to 24 V.
该方案将FPGA逻辑集成到测试中。使用 ChipVORX甚至可以简单高效地解决复杂的测试应用问题。通过通用FPGA模式(无需单独调整)可实现对内部千兆链路和其他功能(频率测量、闪存存取和RAM测试)的访问。
使用JEDOS(针对测试和编程应用进行优化)可以实现具有图形用户界面的复杂功能测试。这些测试为彻底的内存测试、高效的闪存访问或接口测试(以太网、USB等)。测试可以在最短合理时间内实现,且不需要特殊的硬件知识。
Depending on the target application Embedded Functional Test manages either the JTAG interface with
TCK (Test ClocK),
TMS (Test Mode Select),
TDI (Test Data Input),
TDO (Test Data Output),
TRST (Test ReSeT)
or another debug interface.
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