Embedded Board Test

Digital, static and functional test of pins, networks and components

Embedded Board Test describes a test method for modern electronics, using the intelligence of built-in circuits. Various technologies are used which have one thing in common: both generation and application of the test scenarios takes place in one system. The test system consists of a unique, modular control hardware and software.

Embedded Board Test allows digital, static test of pins and networks. Functional tests can also be integrated. These include access to I2C and SPI components, measurement and evaluation of analog processor inputs, dynamic memory tests and test of high-speed interfaces (e.g. USB 3.0.).

Check connections with the Embedded Board Test

The basic approach of embedded board test refers to verifying proper connections on your board under test.

Typical production faults such as short circuits, missing resistors, non-soldered pins and BGA balls, and also errors in high-speed data transmission are found quickly and efficiently. The short execution time and accurate fault diagnosis allow cost-optimised repair.

But the potential of this access is even greater: you can also use the technologies to perform a RAM connection test. In doing so, all address, data and control lines are addressed with firmly defined test patterns. These test patterns can be used to make pin-accurate fault statements regarding the correct connection between the controller and the RAM device.

The connection to external flash components and elements with a serial interface (e.g. I²C, SPI, MIDO, ...) can also be checked. For this purpose, all address, data and control lines are also addressed, and for example, the device and manufacturer ID can be are read out and evaluated. In this way, correct assembly and a faultless connection are verified as well as a wide variety of interfaces are used on your assemblies. For example, you can test digital and analogue IOs as well as functional interfaces (e.g. CAN, Ethernet or USB) with the help of simple adaptations.

Example applications with Embedded Board Test

Depending on the target application the Embedded Board Test manages either the JTAG interface with

TCK (Test ClocK),
TMS (Test Mode Select),
TDI (Test Data Input),
TDO (Test Data Output),
TRST (Test ReSeT)

or another debug interface.

A total of four combinable technologies form the pillars of the Embedded Board Test.