Flying Probe Tester with JTAG Solutions

The Flying Probe test procedure is a flexible solution for testing discrete analog components. With very precise needles ("probes") Flying Probe testers are particularly suitable for small and medium production volumes.

The Flying Probe test’s disadvantage, its execution speed, can be reduced to the lowest level by combining FPT with Embedded JTAG Solutions.

A particular advantage of this combination is the ability to apply the probes as virtual Boundary Scan cells, allowing traces to be tested which were previously untestable with Embedded JTAG Solutions.

Advantages of the Integration in Flying Probe Tester (FPT)

very high fault coverage even with highly compact boards

high flexibility and fast development time due to avoidance of the specimen-specific adapter

"testing without test points" through possible contacting on component pads

simple test program creation, as each test procedure is applied technology-specifically

fast overall system due to possible test step reduction

Specially designed integration packages in various performance classes contain a hardware and software configuration tailored to the ATE (Automatic Test Equipment). The functions of the SYSTEM CASCON software platform are integrated into the ATE software for Flying Probe Testers. A common error report completes the integration solution.

With this combination of test technologies, the user benefits from a multitude of additional test options at board and system level over the entire product life cycle. In contrast to individual systems, integration offers significant advantages in test coverage, diagnostic depth and process optimization.

System integration in Acculogic FLS
- SFX II CUBE Controller
- differential signal transmission to the contacting modules
- up to 8 connections for TAP Interface Cards (TIC Modules)
- adaption of JTAG, SWD, SBW, PIC1x and BDM possible
- CASCON GALAXY for Acculogic Scorpion FLS
- Communication Link Software (CLS) for integration into the Integrator
Further information:
⇒ SCANFLEX II CUBE
An integration of our Embedded JTAG Solutions is available for Digitaltest MTS505/Condor.
System integration in Digitaltest Condor
- SCANFLEX Controller based on PCIe
- TAP transceiver as plug-in card into the base rack
- galvanic isolation of all GÖPEL signals during inactivity
- differential signal transmission into the Probe area
- 6 connections for TAP Interface Cards (TIC Modules)
- adaption of JTAG, SWD, SBW, PIC1x and BDM possible
- interactive tests between JTAG/Boundary Scan and Flying Probes
- CASCON GALAXY for Digitaltest Condor
- Communication Link Software (CLS) for integration into CITE
For further information please refer to the product flyer:
⇒ Brochure Integration in Digitaltest FPT
⇒ SCANFLEX Controller SFX-PCIe 1149
An integration of our Embedded JTAG Solutions is available for Polar Instruments GRS550.
System integration in Polar Instruments GRS
Option 1 with SCANBOOSTER II
- SCANBOOSTER II Controller
- 2 single ended TAPs for JTAG
Option 2 on SCANFLEX II
- SCANFLEX II CUBE
- SFX-5704 measurement module on SFX II CUBE
- “Prober alignment” and “Testpoint detection”
- interactive tests between JTAG/Boundary Scan and Flying Probe
- CASCON GALAXY for Polar Instruments
- Communication Link Software (CLS) for integration into Active Test
For further information please refer to the product flyer:
⇒ Brochure Integration in Polar FPT
⇒ SCANBOOSTER II
⇒ SCANFLEX II CUBE
⇒ SCANFLEX I/O Module SFX-5704
An integration of our Embedded JTAG Solutions is available for Pilot H4/L4/M4/V8.
System integration in Seica Pilot
- SFX II CUBE Controller with SFX-5704 measurement module
- up to 8 connections for TAP Interface Cards (TIC Modules)
- adaption of JTAG, SWD, SBW, PIC1x and BDM possible
- interactive tests between JTAG/Boundary Scan and Flying Probe
- CASCON GALAXY for Seica Pilot
- Communication Link Software (CLS) for integration into VIVA
For further information please refer to the product flyer:
⇒ Brochure Integration in Seica FPT
⇒ SCANFLEX II CUBE
⇒ SCANFLEX I/O Modules
⇒ PicoTAP ATE
An integration of our Embedded JTAG Solutions is available for SPEA 4020/4040/4050/4060/4080.
System integration in SPEA Flying Prober
- SFX II CUBE Controller
- up to 8 connections for TAP Interface Cards (TIC Modules)
- adaption of JTAG, SWD, SBW, PIC1x and BDM possible
- interactive tests between JTAG/Boundary Scan and Flying Probe
- CASCON GALAXY for SPEA Flying Probe
- Communication Link Software (CLS) for integration into Leonardo
For further information please refer to the product flyer:
⇒ Brochure Integration in SPEA FPT
⇒ SCANFLEX II CUBE
An integration of our Embedded JTAG Solutions is available for Takaya APT-1400F/1600FD/9411CE/9600CE.
System integration in Takaya APT
- SFX II CUBE Controller with SFX-5704 measurement module
- up to 8 connections for TAP Interface Cards (TIC Modules)
- adaption of JTAG, SWD, SBW, PIC1x and BDM possible
- interactive tests between JTAG/Boundary Scan and Flying Probe
- support of Multiprobe option in Takaya APT-1600FD
- CASCON GALAXY for Takaya APT
- Communication Link Software (CLS) for integration into APT-SW
For further information please refer to the product flyer:
⇒ Brochure Integration in Takaya FPT
⇒ SCANFLEX II CUBE
⇒ SCANFLEX I/O Modules