Design for Testability
Increased testability and cost reduction through appropriate measures in the development process
The avoidance of errors in electronics already starts in the design process. In order to counteract manufacturing errors as early as possible, circuit-based possibilities must be considered for a subsequent test. Following certain recommendations greatly increases the ability to test the assemblies later - significantly reducing costs.
The Design-for-Testability Guide provides recommendations to achieve stable Embedded JTAG Solutions and optimal test coverage.
