SCANFLEX II - Embedded Test & Programming

SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform.

High Performance Controller for Embedded Test and Programming

Embedded Board Test: significantly improved test depth for complex boards even without the need for needles
Embedded Functional Test in parallel with Embedded Programming
No external programmers necessary

8 independent and parallel Test Access Ports (TAP) for up to 100 MHz
Synchronized operation of embedded test, debugging and programming
Programmable multifunctional 64 channel I/O signal unit
Programmable TAP protocols for numerous processor debug interfaces
Support of up to 31 parallel controlled SCANFLEX I/O modules
Controllable via USB 3.0 and GBit LAN

SCANFLEX II BLADE 4 RMx1/2/3

the industrial version of the SCANFLEX II CUBE in a 19 inch 1U housing with 1, 2 or 3 units

four independent and parallel Test Access Ports (TAP) for up to 100 MHz
support of up to 30 parallel controlled SCANFLEX I/O modules
each individual controller is independent, with separate USB/LAN and power port

unified control platform with 1 x 8 or 2 x 8 independent, true parallel Test Access Ports (TAP) for up to 100 MHz
1 or 2 programmable, multifunctional 64-channel I/O mixed-signal units
support of up to 30 or 60 SFX I/O modules
USB 3.0 and Gbit LAN control interfaces