GOEPEL电子是电气和光学测量及测试技术的全球领导者，为电子元件、印刷电路板组件、工业电子和汽车电子系统提供测试和检测系统。我们的部门包括汽车测试解决方案、嵌入式JTAG解决方案、工业功能测试和检测解决方案（AOI、AXI、SPI、IVS）。
汽车产品在汽车控制单元、汽车座椅、总线通信、声学和声音分析的测试策略中发挥着关键作用，通常用于生产线终端测试，在电动汽车领域应用日益广泛。
我们为利用JTAG接口或相关调试端口的电子开发和制造提供强大的测试和编程解决方案。我们的定制测试系统特别适用于工业电子和PLC系统。
新闻动态
| 汽车测试解决方案
Visit us at PCIM in Nürnberg
| 嵌入式JTAG解决方案
Pioneering test solutions at Embedded World
| 嵌入式JTAG解决方案
FlashFOX für ElectroTEC Pioneer Award 2024 nominiert
| 嵌入式JTAG解决方案
Efficient test coverage analysis with AI support
| 检验解决方案
One platform, One software – Unique
| 嵌入式JTAG解决方案
smart JTAG solutions and a new inspection platform
| 汽车测试解决方案
Video Dragon supports MIPI A-PHY®
| 检验解决方案
Revolution in THT inspection
| 汽车测试解决方案
Next generation network tester NG+
![[Translate to Englisch:] Test Convention 2024](/fileadmin/images/events/2024_Test-Convention_thumbnail_854-480px.jpg)
![[Translate to Englisch:] Boundary Scan und Automotive Test Solutions](/fileadmin/images/events/2024_embeddedworld_PR_1280-720px.jpg "[Translate to Englisch:] Boundary Scan und Automotive Test Solutions")
| 嵌入式JTAG解决方案
Innovative JTAG integration for Seica Flying Prober
| 嵌入式JTAG解决方案
Innovative strength meets diversity at productronica
| 嵌入式JTAG解决方案
First-class test strategies set the tone in MOTORWORLD
| Company
Flawlessly passing the TISAX® assessment
| 汽车测试解决方案
automotive test technologies at VECS 2023
| 嵌入式JTAG解决方案
Latest test and inspection solutions at SMTconnect
| 嵌入式JTAG解决方案
GOEPEL electronic opens branch office in Malaysia
| 嵌入式JTAG解决方案
OiTec became a New GATE Partner for GOEPEL electronic
| 嵌入式JTAG解决方案
SCANFLEX II controller sets new standards
| 嵌入式JTAG解决方案
Latest test and inspection solutions at electronica
| 嵌入式JTAG解决方案
New generation Flash Programmer for production
| 汽车测试解决方案
Haptik- und Akustiktest auf der Sensor+Test
| Artificial Intelligence
Artificial intelligence in electronics manufacturing
| Automation
Man & machine - together they are the strongest
| 嵌入式JTAG解决方案
Security gap log4j - GÖPEL electronic products tested
| 嵌入式JTAG解决方案
SCANFLEX II controller now also available as PXIe
| 嵌入式JTAG解决方案
New JEDOS generation for SoC function test
| 嵌入式JTAG解决方案
Integrated test of digital and analogue I/O signals
| 嵌入式JTAG解决方案
MultiPanel and VIVA 64 Bit Support for Seica Integration
| Events
Automotive Days im Oktober
| Integration
Embedded JTAG Solutions for SPEA4020
![[Translate to Englisch:] Inspectronic](/fileadmin/images/news/inspectronic-gate.gif "[Translate to Englisch:] Inspectronic")
| 嵌入式JTAG解决方案
Functional testing of USB3 interfaces
| 嵌入式JTAG解决方案
Test option for Marvell Automotive Ethernet Switches
| 嵌入式JTAG解决方案
RAPIDO with new Features
| 嵌入式JTAG解决方案
New Modules for Testing CAN-FD and Ethernet Interfaces
| 嵌入式JTAG解决方案
Embedded JTAG Solutions combined with Seica Compact ICT
| 嵌入式JTAG解决方案
New TCA Increases Test Coverage
| 汽车测试解决方案
Sample Point System for CAN/CAN-FD
| 嵌入式JTAG解决方案
Using ADAS SoC as a Test and Programming Instrument
| 汽车测试解决方案
New, compact test system for automotive ECUs
| 嵌入式JTAG解决方案
Embedded JTAG Solutions for SPEA4080
| 嵌入式JTAG解决方案
Subsequent fault diagnosis for SYSTEM CASCON
| 嵌入式JTAG解决方案
Interface tester for most modern bus interfaces
| Integration
JTAG/Boundary Scan for Spectrum ICT von Teradyne
| 汽车测试解决方案
新功能支持CAN FD总线干扰和触发
| 汽车测试解决方案
新一代汽车以太网媒体转换器
| 嵌入式JTAG解决方案
JULIET Test System Enters Third Generation
| 嵌入式JTAG解决方案
VarioTAP for Renesas RH850/F1K
| 嵌入式JTAG解决方案
New developments at electronica 2018
| 嵌入式JTAG解决方案
JTAG Enabled Processor Emulation for Intel Arria 10 SoC
| 嵌入式JTAG解决方案
GÖPEL electronic erweitert VarioTAP®-Emulationstest
| 嵌入式JTAG解决方案
New version of SYSTEM CASCON increases test throughput
| 嵌入式JTAG解决方案
New Functions for JULIET Production Tester
| 汽车测试解决方案
Haptic Test for Car Keys
![[Translate to Englisch:] Neuer Vertriebsingenieur für Inspektionslösungen](/fileadmin/images/news/jens-mille-web.jpg "[Translate to Englisch:] Neuer Vertriebsingenieur für Inspektionslösungen")
| Programming
Flash In-System Programming (ISP) via the Automotive Bus
| 嵌入式JTAG解决方案
New Embedded Test and Programming Interface
| 嵌入式JTAG解决方案
Security and Protection for Xilinx Ultrascale FPGAs
| 嵌入式JTAG解决方案
Combined test technologies for Intel® Arria 10 SoCs
![[Translate to Englisch:] 6. Elektronik Technologie-Forum-Nord](/fileadmin/images/logos/events/2017-ETFN-Logo.jpg "[Translate to Englisch:] 6. Elektronik Technologie-Forum-Nord"){kind=logo}
| Bit Error Rate Test (BERT)
Extension of ChipVORX Technology for Chip Embedded Instruments on Altera Arria V SoC Series
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