The Test Coverage Analyzer (TCA) is a powerful tool in SYSTEM CASCON. The achieved test coverage and potential test gaps are presented in detail. The TCA provides comprehensive information about which nets and pins have been tested sufficiently and which have not.
A new enhancement of the Test Coverage Analyzer in SYSTEM CASCON is referred to as smartTCA. The use of artificial intelligence automates the preparation process for test coverage analysis. After importing CAD or netlist data the smartTCA supports the user with automated classification of components and with the creation of tests, saving time and effort.
The AI recognises circuit structures and analyses the architecture of the board calculating the theoretically possible, estimated test coverage at pin, net and device level.
Test Coverage Analyzer Highlights
- Test Group definition: You can define exactly when an element is considered tested and which attributes are required for it.
- Extended TCA attribute base: Characteristics such as Level (High/Low), Direction (In/Out) or Speed (Dynamic, Static, Functional, Stress) allow you to see at any time how extensively an element has been tested.
- Inclusion of Emulation Technologies: VarioTAP, ChipVORX/SI, JEDOS, and other technologies are now considered with the new TCA
- Improved reports through neighborhood analysis: The neighborhood of an element is identified and analyzed. This significantly increases test coverage accuracy. For example, only short circuits between adjacent pins are considered.
- Comparison of test coverage results: You can see directly what contribution the different test programs make to test coverage.
- Import of external test coverage information: Use information from other test systems (e.g. flying probe tester, in-circuit tester) or inspection systems (e.g. AOI, AXI or SPI) for analysis and get more detailed information about the test coverage of your board.
- Hierarchical visualization: You can adjust the degree of clarity or detail at any time.
Maximum time savings with smartTCA
- Automated component and net classification through AI
- Assignment of library models
- Recognition of component structures and board architectures
- Generation of pseudo library models for test generators of the SYSTEM CASCON software
- Automatic creation of theoretical tests (e.g. infrastructure, interconnection, RAM and Flash tests)
- Output of the theoretically possible estimated test coverage at pin, network and device level
- Manual correction and adjustment of the data by the user for more precise results
The TCA tool in SYSTEM CASCON offers you an optimal approach for analyzing the test coverage of the DUT. This allows you to effectively identify problem areas (e.g. due to insufficient tests) or possible time savings (e.g. due to too many tests).
By using filters and switchable templates for test group definitions, you can change the focus of the analysis at lightning speed. With just a few clicks you can find out not only what was tested, but also how.
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