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In-Circuit-Tester (ICT) with Embedded JTAG Solutions

Integration of Embedded JTAG Solutions in In-Circuit-Tester (ICT)

In-Circuit-Test (ICT) is the most widespread technology at present because the principle allows all electrically detectable faults to be found. But its capability is becoming limited by access difficulties since components have become smaller, and because of more complex narrow width nets and multi-layer boards.

Embedded JTAG Solutions does not have access limitations. A combination is beneficial whenever mechanical access is difficult even though there may be a small number of Boundary Scan components on the PCB.

Steffen Kamprad - Sales Manager
先生 Steffen Kamprad
+49 3641 6896 714 电话

Advantages of the Integration in In-Circuit-Tester

very fast total system consisting of Embedded JTAG Solutions and In-Circuit-Tester

very high fault coverage also for highly compact PCBs

reduction of nail bed adapter costs by saving test points

simple test program generation because each test technology is applied according to its core competence

Boundary Scan and ICT

Additional Test Options at Board and System Level

Specially designed integration packages in various performance classes contain a hardware and software configuration tailored to the ATE (Automatic Test Equipment). The functions of the SYSTEM CASCON software platform are integrated into the ATE software for in-circuit testing. A common error report completes the integration solution.

With this combination of test technologies, the user benefits from a multitude of additional test options at board and system level over the entire product life cycle. In contrast to individual systems, integration offers significant advantages in test coverage, diagnostic depth and process optimization.

Third party ATE partner

System integration in Digitaltest MTS 30/180/300/888

  • SCANFLEX Controller on PCIe basis
  • TAP transceiver as plug-in card for vacuum and cable interfaces
  • galvanic isolation of all GÖPEL signals during inactivity
  • differential signal transmission into the adapter
  • 6 connectors for TAP Interface Cards (TIC Modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • interactive tests between JTAG/Boundary Scan and ICT with Hybrid Cards
  • CASCON GALAXY for Digitaltest MTS ICT
  • Communication Link Software (CLS) for integration into CITE

For further information please refer to the brochure

Brochure Integration in Digitaltest ICT

SCANFLEX Controller SFX-PCIe 1149

SCANFLEX TAP Interface Cards

An integration of our Embedded JTAG Solutions is available for Keysight HP3070/3070/i3070/i5000.

System integration in Keysight 3070

Option 1 with Utility Card

  • plug-on module for Keysight Utility Card
  • 2 single ended TAPs for JTAG

Option 2 on PCI Express basis

  • SCANFLEX PCIe controller
  • TAP transceiver as plug-in card or performance port
  • 4 single ended TAPs for JTAG
  • galvanic isolation of all GÖPEL signals during inactivity

Option 3 on SCANFLEX II CUBE basis

  • SFX II CUBE Controller as internal or external solution
  • differential signal transmission into the adapter
  • up to 8 connectors for TAP Interface Cards (TIC modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • CASCON GALAXY for Keysight 3070
  • Communication Link Software (CLS) for selecting from test plan

For further information please refer to the brochure

Brochure Integration in Keysight ICT

SCANFLEX Controller SFX-PCIe 1149

SCANFLEX TAP Interface Cards

SCANFLEX II CUBE

System integration in Rohde & Schwarz TSVP

  • PXI-based SCANFLEX controller/transceiver
  • PXI-based SCANFLEX controller/transceiver
  • differential signal transmission into the adapter
  • 4 connectors for TAP Interface Cards (TIC modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • interactive Tests between JTAG/Boundary Scan and PMB-Matrix
  • analog measurements and stimuli with PSAM/PSU
  • CASCON GALAXY for Rohde & Schwarz TSVP

For further information please refer to the brochure

Brochure Integration in Rohde & Schwarz ICT

SCANFLEX Controller SFX-PXI 1149

SCANFLEX TAP Interface Cards

An integration of our Embedded JTAG Solutions is available for Seica Compact SL/TK/Multi/Power/XL.

System integration in Seica Compact

  • SFX II CUBE Controller with SFX-5704 measuring module
  • differential signal transmission into the adapter
  • up to 8 connectors for TAP Interface Cards (TIC modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • interactive Tests between JTAG/Boundary Scan and ICT
  • CASCON GALAXY for Seica Compact
  • Communication Link Software (CLS) for integration into VIVA

For further information please refer to the brochure

Brochure Integration in Seica ICT

SCANFLEX II CUBE

SCANFLEX I/O Module

SCANFLEX TAP Interface Cards

An integration of our Embedded JTAG Solutions is available for SPEA 3030 Compact/Inline/Multimode/Multi Core.

System integration in SPEA 3030

  • SFX II CUBE Controller
  • differential signal transmission into the adapter
  • up to 8 connectors for TAP Interface Cards (TIC modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • interactive Tests between JTAG/Boundary Scan and ICT
  • CASCON GALAXY for SPEA 3030
  • Communication Link Software (CLS) for integration into Leonardo

For further information please refer to the brochure

Brochure Integration in SPEA ICT

SCANFLEX II CUBE

SCANFLEX TAP Interface Cards

An integration of our Embedded JTAG Solutions is available for Teradyne Spectrum and TestStation TSx.

System integration in Teradyne Teststation

  • SCANFLEX Controller on PCIe basis
  • TAP Transceiver as plug-in card
  • galvanic isolation of all GÖPEL signals during inactivity 
  • differential signal transmission into the adapter
  • 4 connectors for TAP Interface Cards (TIC modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • version with 8 TAPs as single ended version
  • interactive tests with optional CION module
  • CASCON GALAXY for Teradyne
  • Communication Link Software (CLS) for integration into GR228x/Navigate
  • support of the TSx05x series in line operation

For further information please refer to the brochure

Brochure Integration in Teradyne Teststation ICT

Brochure Integration in Teradyne Spectrum ICT

SCANFLEX Controller SFX-PCIe 1149

SCANFLEX TAP Interface Cards

System integration in TRI TR5001

  • SFX II CUBE Controller
  • adapter card for ICT interface (e.g. VPC)
  • galvanic isolation of all GÖPEL signals during inactivity 
  • differential signal transmission into the adapter
  • 6 Connectors for TAP Interface Cards (TIC Modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • interactive Tests between JTAG/Boundary Scan and ICT
  • CASCON GALAXY for TRI
  • Communication Link Software (CLS) for integration into ETR5x

For further information please refer to the brochure

Brochure Integration in TRI ICT

SCANFLEX II CUBE

SCANFLEX TAP Interface Cards

An integration of our Embedded JTAG Solutions is available for VIAVI 42/52/58xx.

System integration in VIAVI 58xx

  • PXI-based SCANFLEX controller/transceiver
  • differential signal transmission into the adapter
  • 4 connectors for TAP Interface Cards (TIC modules)
  • possible adaption of JTAG, SWD, SBW, PIC1x and BDM
  • interactive tests between JTAG/Boundary Scan and DTP cards
  • CASCON GALAXY for VIAVI

For further information please refer to the brochure

Brochure Integration in VIAVI ICT

SCANFLEX Controller SFX-PXI 1149

SCANFLEX TAP Interface Cards

Applicable technologies for integrations

Embedded JTAG Solutions:
Boundary Scan
Boundary Scan
ChipVORX
IP based software technology
VarioTAP
Processor Emulation Technology
Steffen Kamprad - Sales Manager
先生 Steffen Kamprad
+49 3641 6896 714 电话