Boundary Scan at Standard Level

Digital, static and functional testing of pins, nets and devices

The Standard level uses Boundary Scan cells according to IEEE 1149.1 for testing.

The test speed is far below the actual board function.

The classic connection test is one of the main tasks of this level. But also the addressing of components, e.g. for reading out a chip ID or a sensor value, can be realised at this access level.

In programming, only low data rates are usually achieved (ranging from bytes/s to kBytes/s).

The test and programming applications are controlled exclusively via the JTAG interface. All control, test and programming data are transmitted via this interface.

Embedded Board Test at Standard Level

Structural and Parametric Test with Boundary Scan


  • verification of JTAG Infrastructure
  • detection of shorts between Boundar Scan Nets
  • detection of shorts between IEEE 1149.6 Nets
  • detection of open pins
  • detection of missing inline resistors
  • detection of missing or wrong pull resistors
  • testing beyond multipanel PCBs
  • use of additional virtual boundary scan I/Os (GPIOs, Flying Probes ...)

Embedded Functional Test at Standard Level

Functional Test with Boundary Scan


  • static RAM connection test
  • static access to  non-Boundary-Scan elements
  • level shifter, Driver ICs, analog switches
  • logic components
  • memory, RTC, sensors, PHY…
  • LED
  • switches
  • summer
  • optocoupler
  • Embedded BIST, IEEE P1687 support
  • parametric tests with µprocessor GPIOs, ADCs and DACs

Embedded Programming at Standard Level

Flash Memory Programming and Configuration of (C)PLDs/FPGAs with Boundary Scan


  • programming in the kilobytes data range
  • (C)PLD/FPGA Configuration with SVF, JAM, STAPL, IEEE 1532
  • EEPROM / Flash Programming
  • I2C, SPI, Microwire, NOR, NAND, PCM, eMMC ...

Test Speed

The test speed is always related to a pin or a pin group and depends on the intended use in the future application.


The signal change runs far below the functional speed of the controlling pin(s). Usually, these are boundary scan or GPIO-controlled accesses that run slowly due to the serial shifting processes via the JTAG interface (e.g. the flashing of an LED with confirmation by the operator).

Programming Speed

The programming speed depends on the amount of data to be transmitted and is dependent on several factors. Without knowledge of the application, precise statements are therefore usually not possible. Information on speed is always subjective and depends on the application.

Low to medium programming speed

With Boundary Scan, only low programming speeds of a few bytes/s to kBytes/s can be achieved.

Applications from GÖPEL electronic

The Standard level is applied with the following combinable technologies

  • JTAG-based Test

    The standard Boundary Scan method according to IEEE 1149.1  can simply control complex components such as FPGAs, processors, controller and CPLDs. Detailed hardware knowledge is not required.

    » Learn more about Boundary Scan


  • FPGA-based Test

    The ChipVORX technology uses the FPGA logic for the test. With the help of universal FPGA models, you can access standard functions without further adjustments. This allows classic boundary scan tests and programming to be significantly accelerated. Atypical tests such as frequency measurement can also be realised.

    » Learn more about ChipVORX


  • µProcessor-based Test

    A processor-specific model brings the IC into debug mode. After that, internal functions (registers, memory areas, complex controllers) are addressed to perform analogue measurements, at-speed Flash programming or even at-speed RAM tests. Both the JTAG port and other debug interfaces can be used for this purpose.

    » Learn more about VarioTAP

The basis of all testing and programming is the hardware architecture SCANFLEX II to control the UUT . 

» Learn more about SCANFLEX II


The cost-efficient controller SCANBOOSTER II is especially recommended for entry-level users. It is best suited for standard applications with lower performance requirements.

» Learn more about the SCANBOOSTER II


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Steffen Kamprad - Sales Manager
M. Steffen Kamprad