Embedded Board Test describes a test method for modern electronics, using the intelligence of built-in circuits. Various technologies are used which have one thing in common: both generation and application of the test scenarios takes place in one system. The test system consists of a unique, modular control hardware and software.
Embedded Board Test allows digital, static test of pins and networks. Functional tests can also be integrated. These include access to I2C and SPI components, measurement and evaluation of analog processor inputs, dynamic memory tests and test of high-speed interfaces (e.g. USB 3.0.).
The basic approach of embedded board test refers to verifying proper connections on your board under test.
Typical production faults such as short circuits, missing resistors, non-soldered pins and BGA balls, and also errors in high-speed data transmission are found quickly and efficiently. The short execution time and accurate fault diagnosis allow cost-optimised repair.
But the potential of this access is even greater: you can also use the technologies to perform a RAM connection test. In doing so, all address, data and control lines are addressed with firmly defined test patterns. These test patterns can be used to make pin-accurate fault statements regarding the correct connection between the controller and the RAM device.
The connection to external flash components and elements with a serial interface (e.g. I²C, SPI, MIDO, ...) can also be checked. For this purpose, all address, data and control lines are also addressed, and for example, the device and manufacturer ID can be are read out and evaluated. In this way, correct assembly and a faultless connection are verified as well as a wide variety of interfaces are used on your assemblies. For example, you can test digital and analogue IOs as well as functional interfaces (e.g. CAN, Ethernet or USB) with the help of simple adaptations.
Depending on the target application the Embedded Board Test manages either the JTAG interface with
TCK (Test ClocK),
TMS (Test Mode Select),
TDI (Test Data Input),
TDO (Test Data Output),
TRST (Test ReSeT)
or another debug interface.
- JTAG based test access (Boundary Scan)
FPGA based tests (ChipVORX)
This method integrates the FPGA logic into the test. Even complex test applications are easy and efficient to solve with ChipVORX. Access to internal Gigabit links and other functions (frequency measurement, flash access, RAM tests) are possible via universal FPGA models (no separate adaption necessary).
Processor-based tests (VarioTAP)
A processor-specific model allows the processor to enter the debug mode. With VarioTAP individual functions (analog registers, flash access, real-time RAM tests) are addressed. Both the JTAG port and other debug interfaces are supported.
Processor-based tests with a universal (JEDOS)
Using JEDOS (optimized for test and programming applications), complex function tests with a graphical user interface can be achieved. These are complete memory tests, efficient flash access or interface tests (Ethernet, USB …). The tests can be created in the shortest possible time without special hardware knowledge.