Demande
In-Circuit-Tester (ICT) with Embedded JTAG Solutions
Integration of Embedded JTAG Solutions in In-Circuit-Tester (ICT)
In-Circuit-Test (ICT) is the most widespread technology at present because the principle allows all electrically detectable faults to be found. But its capability is becoming limited by access difficulties since components have become smaller, and because of more complex narrow width nets and multi-layer boards.
Embedded JTAG Solutions does not have access limitations. A combination is beneficial whenever mechanical access is difficult even though there may be a small number of Boundary Scan components on the PCB.
Advantages of the Integration in In-Circuit-Tester
very fast total system consisting of Embedded JTAG Solutions and In-Circuit-Tester
very high fault coverage also for highly compact PCBs
reduction of nail bed adapter costs by saving test points
simple test program generation because each test technology is applied according to its core competence
Additional Test Options at Board and System Level
Specially designed integration packages in various performance classes contain a hardware and software configuration tailored to the ATE (Automatic Test Equipment). The functions of the SYSTEM CASCON software platform are integrated into the ATE software for in-circuit testing. A common error report completes the integration solution.
With this combination of test technologies, the user benefits from a multitude of additional test options at board and system level over the entire product life cycle. In contrast to individual systems, integration offers significant advantages in test coverage, diagnostic depth and process optimization.
