JEDOS - Embedded Functional Test, Diagnostics and Programming

JEDOS is the "JTAG Embedded Diagnostics Operating System". As embedded test & diagnostics operating system it is able to perform functional tests in real time using the native processor. It provides maximum fault coverage and comprehensive diagnoses for digital, analog and mixed-signal components.

The fully functional operating system is loaded via JTAG. Neither flash firmware nor special test software is required.

JEDOS supports you in the design validation of prototypes as well as in parallel testing and programming in production.

Functions and Specifications

  • JEDOS Application Commander

    Core module of JEDOS, enables handling of functional IP’s, report generation and JTAG control

  • DDR Test

    Functional at-speed / real time test of DDR devices with selectable algorithms (address test, burst test, noise test, stress test, cell test)

  • DDR Calibration

    Functional Margin Test of DDR I/F with pre-defined parameters for the DDR RAM Controller, or automated search of case optimized parameters

  • Peripheral I/O Test

    Functional at-speed / real time test of GPIO, UART, PCI, PCIe, Ethernet LAN, USB 2.0, USB 3.0

  • Universal Function Test

    Load, execution and dynamic control of pre-compiled, JEDOS compliant IP generated by the user or from 3rd party for any kind of functional Test

  • In-System Device Programming

    High speed programming of non-volatile devices like NAND, NOR, SPI, I2C, eMMC, MCU via streaming through communication I/F (USB 2.0, USB 3.0, LAN) or download from external connected USB Flash memory

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