Automated generation of integrated test applications

JTAG integration into SPEA 4020/4040/4050/4060/4080

Our integration packages for SPEA Flying Probe Testers are OEM-certified and come in several configurations, ranging from basic packages focusing on in-system programming only or on basic boundary-scan tests, to an advanced package providing fully automated interaction of all probes with Boundary Scan devices and supporting all our embedded JTAG solutions.

The combination of SPEA Flying Probe tester and Embedded JTAG Solutions from GOEPEL electronics not only enhances test coverage and fault diagnosis, but also has the potential to significantly reduce test time.
 

Integrate our Embedded JTAG Solutions in SPEA 4020/4040/4050/4060/4080

Increase
fault
coverage

Reduce
 test time

Interactive 
tests

JTAG, SWD, SBW
PIC1x and BDM 

Fully automated interaction between all probes and Boundary Scan