New JEDOS generation for SoC function test

Test SoC components without the use of firmware

JEDOS II is the extension of the JEDOS technology (JTAG Embedded Diagnostics Operating System) from GÖPEL electronic. The main task is embedded test & embedded programming of complex electronic designs. JEDOS II has now been developed in particular for the diagnostic functional test of System-on-Chip (SoC) components.

JEDOS II architecture represents a complete Real Time Operating System (RTOS) that utilises the natively integrated processors to perform embedded diagnostic functional testing and programming in real time. It is loaded and controlled into the processor via JTAG or alternative debug interfaces. This means that users do not need any native firmware. JEDOS II offers a wide range of functions for testing and validating bus systems and high-speed interfaces, as well as for programming flash devices. Due to its mode of operation, JEDOS II shifts the test balance even further into the DUT and is thus an important step on the way to embedded ATE.

The primary advantage of JEDOS II is the ability to comprehensively and deeply test SoC components without the use of firmware. This provides software developers with pre-verified prototype hardware and makes fault isolation much more efficient. JEDOS II also supports execution in multiple use (panel test) and allows multi-tasking (e.g. flash programming via Ethernet and simultaneous testing of other bus systems). The first supported family is Xilinx Zynq7000. Xilinx Zynq UltraScalePlus, Infineon Tricore, selected Renesas and NXP families will follow.

Created by Matthias Müller | | Embedded JTAG Solutions