JTAG/Boundary Scan integration into Takaya 1600FD with multiprobe option

Combination of test techniques and saving of handling steps

The system integration of JTAG/Boundary Scan for the Takaya Flying Probe Systems has been extended by an additional variation. A specially designed hardware and software package from GOEPEL electronic is used to combine the Embedded JTAG Solutions with Takaya APT1600FD with Multiprobe option. This enables the user to flexibly contact his own pad geometries with a mini adapter.

The Multiprobe is implemented as standard on the bottom as an alternative tool to Probe 5 or 6. This ensures compact contacting of JTAG-relevant signals including UUT supply. Thus all JTAG/Boundary Scan tests as well as programming can be integrated into a fully automated inline system with loader and unloader. Due to the smooth interaction of Takaya APT and GOEPEL electronic software, electronic devices can first be tested MDA and Boundary Scan, then programmed and finally function tested. The integration package by GOEPEL electronic is based on the SFX II CUBE architecture and contains specially adapted components for the multiprobe option.

The integration into the APT1600FD eliminates the manual contacting between JTAG/Boundary Scan components and the DUT, thus saving handling steps. Component test, JTAG/Boundary Scan, programming and function test are now performed on one system. Due to the increasing speed and flexibility of flying testers, they are increasingly becoming the focus of medium volume productions. This in turn saves adapter costs and minimises time-to-market. The gap of reduced access possibilities is excellently closed by the JTAG/Boundary Scan integration.

Created by Matthias Müller | | Embedded JTAG Solutions

JTAG/Boundary Scan Integration in Takaya 1600FD with Multiprobe option