Pinpoint failures rather than spend ages searching – Embedded JTAG Solutions for analysis and repair

When failures occur in complex PCBAs, rapid root-cause analysis and precise diagnostics are significant. Embedded JTAG solutions enable pin-level localisation of connection, soldering and functio-nal failures – even where physical access to the circuit is limited. This allows failures to be analysed precisely, repair processes to be accelerated and downtime to be reduced.

Find out how integrated test resources from boundary scan, processors and FPGAs can be utilised for efficient fault diagnosis, and how modern embedded test methods support the analysis of complex PCBAs throughout the entire product lifecycle.

Speaker: Alexander Labrada Diaz, GÖPEL electronic

Participation in this webinar is free of charge. Seats are limited.

Are you unable to attend at the specified time? Register anyway and you will receive the link to the recording afterwards.