At the Professional level, the user achieves higher access speeds (At-Speed or Nominal-Speed). Although the test speed is still below the actual board function in most applications , it is significantly faster than with the conventional boundary scan test (no static signal change)
Basically, the test speed is now defined by the debug access. For example, a RAM connection test with "Boundary Scan plus" can also detect and diagnose dynamic problems at termination resistors.
Significantly higher speeds can also be reached during programming using VarioTAP or ChipVORX (in the range of kBytes/s tp MBytes/s).
Test and programming at the Professional Level are controlled via JTAG interface or a debug interface, e.g. via SWD (ARM), DAP (Infineon) and others.
Applications:
Applications:
Applications:
The test speed is always related to a pin or a pin group and depends on the intended use in the future application.
Static
The signal change runs far below the functional speed of the controlling pin(s). Usually, these are boundary scan or GPIO-controlled accesses that run slowly due to the serial shifting processes via the JTAG interface (e.g. the flashing of an LED with confirmation by the operator).
JTAG-based Test
The standardised Boundary Scan method according to IEEE 1149.1 can simply control complex components such as FPGAs, processors, controller and CPLDs. Detailed hardware knowledge is not required.
FPGA-based Test
The ChipVORX technology uses the FPGA logic for the test. With the help of universal FPGA models, you can access standard functions without further adjustments. This allows classic boundary scan tests and programming to be significantly accelerated. Non typical tests such as frequency measurement can also be realised.
µProcessor-based Test
A processor-specific model brings the IC into debug mode. After that, internal functions (registers, memory areas, complex controllers) are addressed to perform analogue measurements, at-speed Flash programming or even at-speed RAM tests. Both the JTAG port and other debug interfaces can be used for this purpose.
The basis of all testing and programming is the hardware architecture SCANFLEX II to control the UUT .
» Learn more about SCANFLEX II
The cost-efficient controller SCANBOOSTER II is especially recommended for entry-level users. It is best suited for standard applications with lower performance requirements.
BARCUDA
BARCUDA - the complete solution for testing & programming electronic assemblies. Process up to 32 assemblies in parallel. With BARCUDA VP230 you can test and program assemblies with or without JTAG/Boundary Scan - without the time-consuming configuration of a special in-house test system.
» BARCUDAFlashFOX®The small stand-alone programmer can program and validate up to eight UUTs simultaneously. In-system programming of microcontrollers, flash components and PLD/FPGAs. It is suitable for industrial use in 24/7 operation.
» FlashFOX®Contact us!
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