Skip to main content

Functional Test with Embedded JTAG Solutions

Combination of Embedded JTAG Solutions with Functional Test (FT)

Functional Test has long been established as a reliable instrument for quality assurance, but the increasing complexity of today’s designs makes it difficult and time consuming to create test programs.

Today, it is practically impossible to test every function of a highly complex UUT.

A combination of Functional Test and Embedded JTAG Solutions makes sense since Embedded JTAG Solutions does not test the circuit’s functionality but uses its pins for driving and measuring the PCB traces. Therefore, the test of an interface is very simple. The assessment of functions, which can rarely be attained during “normal operations”, can easily be tested. Furthermore, Embedded JTAG Solutions enables the fault diagnosis at pin level which is extremely useful for subsequent repair of the PCB.

Integrations in Functional Testers are customer-specific

Integrations in Functional Test Systems are usually very customer-specific and can be implemented in different variants. The solutions listed represent a small selection of projects that have already been implemented.

Steffen Kamprad - Sales Manager
Mr. Steffen Kamprad
+49 3641 6896 714 Phone

Advantages of the Combination with Functional Test Systems

increase in test depth

fault diagnostic at pin level

test program generation becomes far simpler

PCB programming

control of functions with the technologies of Embedded JTAG Solutions

 Combination of Embedded JTAG Solutions with Functional Test (FT)

Additional Test Options at Board and System Level

Specially designed integration packages in various performance classes contain a hardware and software configuration tailored to the ATE (Automatic Test Equipment). The functions of the SYSTEM CASCON software platform are integrated into the ATE software for Functional Tester. A common error report completes the integration solution.

With this combination of test technologies, the user benefits from a multitude of additional test options at board and system level over the entire product life cycle. In contrast to individual systems, integration offers significant advantages in test coverage, diagnostic depth and process optimization.

Third party ATE partner

System integration in 6TL Function Test

Option 1 with SCANFLEX II Controller

  • SFX II CUBE Controller
  • adapter card with VPC Interface (Virginia Panel Corp.)
  • galvanic isolation of all GÖPEL signals during inactivity
  • differential signal transmission into the adapter
  • 6 Connectors for TAP Interface Cards (TIC Modules)
  • adaption of JTAG, SWD, SBW, PIC1x and BDM possible

Option 2 based on PCI Express

  • SCANFLEX Controller with PCIe
  • Transceiver card with VPC interface
  • 16 TAP connections for JTAG, SWD, SBW, PIC1x or BDM

Both versions can be expanded with VPC-based hardware as required. Possible add-ons are:

  • card for power management on 16 UUTs
  • extension with 128 MPP channels
  • test pattern card with 128 I/O channels
  • analogue measurement card with 128 channels

 

 

System integration in Eiger Design Function Test

Option 1 with SCANBOOSTER

  • SCANBOOSTER Controller
  • 2 single ended TAPs for JTAG

Option 2 with SCANFLEX II Controller

  • SFX II CUBE Controller
  • up to 8 TAP connections
  • adaption of JTAG, SWD, SBW, PIC1x and BDM possible

Further information:

SCANBOOSTER

SCANFLEX II CUBE

System integration in LXinstruments Function Test

  • SFX II CUBE Controller
  • adapter card with VPC Interface (Virginia Panel Corp.)
  • differential signal transmission into the adapter
  • 6 Connectors for TAP Interface Cards (TIC Modules)
  • adaption of JTAG, SWD, SBW, PIC1x and BDM possible
  • galvanic isolation of all UUT GNDs in the panel test
  • customer-specific expansion with different variants possible

Further information:

SCANFLEX II CUBE

SCANFLEX TAP Interface Cards

System integration in National Instruments function tests

  • SCANFLEX Controller/Transceiver based on PXI
  • differential signal transmission into the adapter
  • 4 Connectors for TAP Interface Cards (TIC Modules)
  • adaption of JTAG, SWD, SBW, PIC1x and BDM possible
  • PXI extension with192 I/O channels per slot possible
  • integration in Teststand, LabView and CVI/Labwindows

Further information:

SCANFLEX Controller SFX-PXI 1149

SCANFLEX TAP Interface Cards

System integration in Test-OK function test

Option 1 with SCANBOOSTER

  • SCANBOOSTER Controller as Plug-on Module
  • 2 single ended TAPs for JTAG

Option 2 with SCANFLEX II Controller 

  • SFX II CUBE Controller
  • differential signal transmission into the adapter
  • up to 8 connectors for TAP Interface Cards (TIC Modules)
  • adaption of JTAG, SWD, SBW, PIC1x and BDM possible

Further information:

SCANBOOSTER

SCANFLEX II CUBE

 

System integration in Visatronic function test

Option 1 with SCANBOOSTER

  • SCANBOOSTER Controller
  • 2 single ended TAPs for JTAG

Option 2 with SCANFLEX II Controller 

  • SFX II CUBE Controller
  • up to 8 TAP connections
  • adaption of JTAG, SWD, SBW, PIC1x and BDM possible

Further information:

SCANBOOSTER

SCANFLEX II CUBE

Applicable technologies for integrations

Embedded JTAG Solutions:
Boundary Scan
Boundary Scan
ChipVORX
IP based software technology
VarioTAP
Processor Emulation Technology
Steffen Kamprad - Sales Manager
Mr. Steffen Kamprad
+49 3641 6896 714 Phone