Embedded Functional Test, Diagnostics and Programming
JEDOS
JEDOS is the „JTAG Embedded Diagnostics Operating System“. As embedded test & diagnostics operating system it is able to perform functional tests in real time using the native processor. It provides maximum fault coverage and comprehensive diagnoses for digital, analog and mixed-signal components.
The fully functional operating system is loaded via JTAG. Neither flash firmware nor special test software is required.
JEDOS supports you in the design validation of prototypes as well as in parallel testing and programming in production.
![[Translate to Englisch:] Eingebetteter diagnostischer Funktionstest und Programmierung](/fileadmin/images/ejs/logos/JEDOS_Logo.gif "[Translate to Englisch:] JEDOS"){kind=logo}
Functions and Specifications
Core module of JEDOS, enables handling of functional IP’s, report generation and JTAG control
Functional at-speed / real time test of DDR devices with selectable algorithms (address test, burst test, noise test, stress test, cell test)
Functional Margin Test of DDR I/F with pre-defined parameters for the DDR RAM Controller, or automated search of case optimized parameters
Functional at-speed / real time test of GPIO, UART, PCI, PCIe, Ethernet LAN, USB 2.0, USB 3.0
Load, execution and dynamic control of pre-compiled, JEDOS compliant IP generated by the user or from 3rd party for any kind of functional Test
High speed programming of non-volatile devices like NAND, NOR, SPI, I2C, eMMC, MCU via streaming through communication I/F (USB 2.0, USB 3.0, LAN) or download from external connected USB Flash memory
