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[Translate to Englisch:] Inspektion von Direct Copper Bonded Substraten (DCB)
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Embedded JTAG Solutions
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News from the Embedded JTAG Solutions
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10/14/2019
New TCA Increases Test Coverage
09/30/2019
New VarioTAP Models for Texas Instruments and NXP Processors
08/20/2019
New SCANFLEX II TAP Interface Card (TIC) for full 5V compatibility
06/25/2019
Using ADAS SoC as a Test and Programming Instrument
05/03/2019
Emulation technology VarioTAP available for two more Texas Instruments processors
05/03/2019
Embedded JTAG Solutions for SPEA4080
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