News from the Embedded JTAG Solutions - GÖPEL electronic

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Page 15 of 16.

Enics Group became a new GATE partner

01/16/2017 | Embedded JTAG Solutions

Enics Group Became a New GATE Partner for GOEPEL electronic

i.MX6 family from NXP

12/07/2016 | Embedded JTAG Solutions

Test and Diagnostics Operating System JEDOS now available for i.MX6 Processors from NXP

ChipVORX Module with USB 3.0 adapter from INGUN

11/10/2016 | Embedded JTAG Solutions

INGUN and GOEPEL electronic cooperate for full testing of high-speed interfaces "Made in Germany"

GCaT Gigabit Cable Tester

11/09/2016 | Embedded JTAG Solutions

Testing the transmission quality of high-speed link cables

Boris Opfer (left, SYSTECH Europe) and Alexander Beck (right, GÖPEL electronic) implement the integration of the Boundary Scan in the Flying Probe Test system APT-1400F

11/07/2016 | Embedded JTAG Solutions

Combined test methods: JTAG/Boundary Scan available for Flying Prober Testers from TAKAYA

SPEA 4060 Flying Probe Tester

10/05/2016 | Embedded JTAG Solutions

Improved Production Throughput in SPEA Flying Probe Systems through Extension of Boundary Scan Integration

Page 15 of 16.

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