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JTAG/Boundary Scan
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Integration of JTAG/Boundary Scan with Flying Prober Tester (FPT), In-Circuit-Test (ICT) systems, Functional Testers (FT) or Automated Inspection (AOI/AXI) - GOEPEL electronics

Functional principle of the integration into an existing ATE system

JTAG/Boundary Scan – a versatile tool for integrating into an existing ATE system

You already have a test system and would like to integrate Boundary Scan?
Find our partners for integration with the respective GOEPEL electronic hardware and software.

Each test technology is limited in terms of fault or test coverage because there are certain fault types which can only be detected by a particular test technique. The following fault types can be distinguished:

Electrically, but not optically detectable failures

Optically, but not electrically detectable failures

Electrically defective component

Mechanically defective components (e.g. bent pins)

Missing SMD and THT components, electrically testable

Missing SMD and THT components, electrically untestable (e.g. parallel capacitors, connectors)

Open solder joints on SMD and THT components

Wrong component labels (e.g. wrong supplier, dielectric strength etc.)

Misplaced SMD and THT components (e.g. wrong position, wrong height)

Wrongly polarized mechanical components (e.g. wrongly polarized connectors and sockets)

Insufficient solder joints, but with electrical contact

Another important factor is the increase in complexity of current and future component assemblies. Models such as BGA, µBGA or Flip Chip can rarely be mechanically accessed. In order to attain an optimal or maximal test depth it makes sense to combine test technologies. GOEPEL electronic is one of the leading vendors of innovative test and inspection systems that provides extended solutions for the combination of JTAG/Boundary Scan with the Automated Inspection (AOI/AXI), Flying Probe testers, Functional Test systems and In-Circuit testers.

 

GOEPEL electronic KundenwebseiteAs a GOEPEL electronic customer you will find current softwareupdates for Boundary Scan integration at our customers' website www.goepel-genesis.com.

 

 

 

 

Complete Systems

In addition to its high performance stand-alone tools and the possibility to integrate/combine JTAG/Boundary Scan with other test technologies, GÖPEL electronic offers cmplete systems with integrated Boundary Scan. These are the SCANTURY® BScan Prober, the SCANTURY® series PXI 50xx Tester Complete Systems as well as our AOI systems OptiCon [AOI – OptiCon]. Don’t hesitate to contact us when you are looking for an integrated solution.

Brochures about the integration of JTAG/Boundary Scan in AOI systems, Flying Prober and In-Circuit-Tester can be downloaded [here]

Please test our interactive learning software for IEEE 1149.x, the Boundary Scan Coach which guides you to the basics and application of Boundary Scan/JTAG [Boundary Scan Coach]

You will find brochures, documents and request forms in our download center.

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GOEPEL electronics Ltd., Unit 1A, The Old Granary, Westwick, Cambridge, CB24 3AR
Phone +44-1223-858298, Fax +44-1223-257800, www.goepel.co.uk
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