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| SCANFLEX® is a revolutionary new hardware platform, created to enable for extended Boundary Scan test and ISP solutions, taking full advantage of the technical potential provided by today’s and tomorrow’s standards. SCANFLEX excels when it comes to speed, flexibility, and modularity of a Boundary Scan test system. But it does not stop there, adding new capabilities for analog and mixed-signal test not found in competitive products. |
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| We recently introduced the all new VarioCore® technology for SCANFLEX® I/O Modules, once again proving our role as a leading JTAG/Boundary Scan innovator. VarioCore® enabled I/O Modules are unique in the world of board and system level Automated Test Equipment (ATE) in that they are instruments that are reconfigurable at run-time to support a wide variety of I/O functionality. |
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The standardization of IEEE-Std. 1149.1 (JTAG / Boundary Scan) in 1990 set the foundation for one of the most successful test technologies. Additional standards, based on the IEEE-Std. 1149.1 architecture, have been developed to support innovative test and in-system programming applications, in particular IEEE-Std. 1532, IEEE-Std. 1149.4, and IEEE-Std. 1149.6, and further standard development efforts are under way.
SCANFLEX® encompasses:
| Total Modularity | |
| Modular platform consisting of SCANFLEX Controller, SCANFLEX TAP-Transceiver, and SCANFLEX I/O modules allowing individually (re)configurable solutions | |
| Modular expandable number of (up to 8) parallel, independent TAP and (up to 31) independent I/O modules, ensuring open scalability of required resources | |
| Modular, interchangeable TAP Interface Cards (TIC) support a variety of interface types and integration environments | |
 | Extreme Flexibility | |
| Flexible electrical signal termination (up to 8 per TAP programmable interface parameters) | |
| Flexible distribution of the individual TAP’s and I/O modules with distances of up to 10m/33ft from the Controller without performance drop | |
| Flexible analog and digital resources on every TAP-Transceiver as standard configuration, systematically extendable with optional I/O modules | |
 | Extraordinary Performance | |
| High-performance SPACETM II Controller Chipset supporting HYSCANTM for simultaneous handling of parallel I/O pattern and serial scan pattern up to 80MHz on 8 independent TAP’s | |
| Highly efficient synchronization of analog, digital and mixed signal resources with dynamic TAP operations and external trigger events | |
| Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALETM Technology | |
SCANFLEX® concept – an overview (example configuration)
Test and ISP applications benefit from SCANFLEX
| Consistent hardware platform for a multitude of test and programming procedures |
 | Modular concept ensures lowest overhead through scalable, customizable solutions |
 | Optimized for integration into 3rd party Flying Probe, ICT, MDA, or Functional Test |
| State-of-the-art system architecture with data splitting for serial and parallel resources |
 | Extended Boundary Scan tests with highest possible fault coverage |
 | The latest link technologies ensure high performance data transmission |
| Open architecture ensures efficient support for today’s and tomorrow's standards |
 | Continuous expansion of the product portfolio, worldwide application support |
 | Custom specific front-end solutions through SCANFLEX® Engineering |
| Complete support of all hardware features through SYSTEM CASCON® software |
