Functional Test (FT)

Combination of JTAG/Boundary Scan with Functional Test (FT)

Functional Test has long been established as a reliable instrument for quality assurance, but the increasing complexity of todays designs makes it difficult and time consuming to create test programs. Today, it is practically impossible to test every function of a highly complex UUT. A combination of Functional Test and JTAG/Boundary Scan makes sense since Boundary Scan does not test the circuit’s functionality but uses its pins for driving and measuring the PCB traces. Therefore, the test of an interface is very simple. The assessment of functions, which can rarely be attained during “normal operations”, can easily be tested. Furthermore, Boundary Scan enables the fault diagnosis at pin level which is extremely useful for subsequent repair of the PCB.