IEEE 1149.1 Testability Devices
JTAG/Boundary Scan as an innovative DfT method requires respective scanable components on the unit under test (UUT) for its application. Yet, this cannot always sufficiently be realized in practice, as, for example, edge connectors do not provide such features. Another problem is that not all types of components are available as scanable devices, therefore non-scanable clusters are unavoidable. Both problems can be solved or at least alleviated by following CION™ technology.
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 | The CION™ (Configurable I/O Network) is a universal Parallel I/O ASIC with special JTAG/Boundary Scan test features. Applying one of the 4 functional modes it can both be used to improve on-board testability or to create external test adapters. Its 32 I/O signals are divided into 4 independent 8bit ports. Due to the wide I/O voltage range, a large number of logic families are supported. Every channel can independently be set to input, output, bi-directional or in high-impedance state. The output buffers are able to drive high currents and are equipped with an unstress feature for UUT and CION ™ protection and hotswap capability. Highlights:
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