|
|
Home > JTAG/Boundary Scan > Integration in ATE Systems
JTAG/Boundary Scan – a versatile tool for integrating into an existing ATE system
Each test technology is limited in terms of fault or test coverage because there are certain fault types which can only be detected by a particular test technique. The following fault types can be distinguished:
| Electrically, but not optically detectable failures | Optically, but not electrically detectable failures |
|---|
Electrically defective component | Mechanically defective components (e.g. bent pins) | Missing SMD and THT components, electrically testable | Missing SMD and THT components, electrically untestable (e.g. parallel capacitors, connectors) | Open solder joints on SMD and THT components | Wrong component labels (e.g. wrong supplier, dielectric strength etc.) | | Misplaced SMD and THT components (e.g. wrong position, wrong height) | | Wrongly polarized mechanical components (e.g. wrongly polarized connectors and sockets) | | Insufficient solder joints, but with electrical contact |
Another important factor is the increase in complexity of current and future component assemblies. Models such as BGA, µBGA or Flip Chip can rarely be mechanically accessed. In order to attain an optimal or maximal test depth it makes sense to combine test technologies. GÖPEL electronic is one of the leading vendors of innovative test and inspection systems that provides extended solutions for the combination of JTAG/Boundary Scan with the Automated Optical Inspection (AOI), Flying Probe testers, Functional Test systems and In-Circuit testers.
 As a GOEPEL electronic customer you will find current softwareupdates for Boundary Scan integration at our customers' website www.goepel-genesis.com.
Last update: 6 June 2008
Combination JTAG/Boundary Scan with Automated Optical Inspection (AOI)
|  | Boundary Scan not only closes the gap an AOI system leaves in regards to functional accuracy, but enables the testing of components that are not optically testable. Since Boundary Scan only needs a single port test bus for testing a PCB, this technology can easily and reliably be integrated into an AOI system. The combination BScan/AOI optionally provides a fault coverage close to 100% at minimal cost. | |
Advantages: - Very high fault coverage
- High flexibility, because no UUT specific adapter is required
- Parallel execution of both test techniques
- Simple integration of BScan in an AOI system
- One-stop availability because GÖPEL electronic is a vendor of both test technologies
To top
JTAG/Boundary Scan integration in Flying Probe test systems
| 
| As an outstanding integration partner, GÖPEL electronic is highly experienced in this area and has been working very closely and successfully with well-known vendors of Flying Probers for many years. The Flying Probe test’s disadvantage, its execution speed, can be reduced to the lowest level by combining FPT with Boundary Scan. A particular advantage of this combination is the ability to apply the probes as virtual Boundary Scan cells, allowing traces to be tested which were previously untestable with JTAG/Boundary Scan.
| |
Advantages: - Fast total system
- Very high fault coverage, also for highly complex PCBs
- High flexibility because no UUT specific adapter is required
- Easy test program generation using automatic software
JTAG/Boundary Scan integration in In-Circuit-Test systems
|  | In-Circuit-Test (ITC) is the most widespread technology at present because the principle allows all electrically detectable faults to be found. But its capability is becoming limited by access difficulties since components have become smaller, and because of more complex narrow width nets and multi-layer boards. Boundary Scan does not have access limitations. A combination is beneficial whenever mechanical access is difficult even though there may be a small number of Boundary Scan components on the PCB. |
|
Advantages: - Very fast total system
- Very high fault coverage also for highly compact PCBs
- Reduction of nail bed adapter costs
- Simple test program generation because each test technology is applied according to its core competence
Combination of JTAG/Boundary Scan with Functional Test
| Functional Test has long been established as a reliable instrument for quality assurance, but the increasing complexity of todays designs makes it difficult and time consuming to create test programs. Today, it is practically impossible to test every function of a highly complex UUT. A combination of Functional Test and JTAG/Boundary Scan makes sense since Boundary Scan does not test the circuit’s functionality but uses its pins for driving and measuring the PCB traces. Therefore, the test of an interface is very simple. The assessment of functions, which can rarely be attained during “normal operations”, can easily be tested. Furthermore, Boundary Scan enables the fault diagnosis at pin level which is extremely useful for subsequent repair of the PCB.
| |
Advantages: - Increase in test depth
- Fault diagnostic at pin level
- Test program generation becomes far simpler
Complete Systems
| In addition to its high performance stand-alone tools and the possibility to integrate/combine JTAG/Boundary Scan with other test technologies, GÖPEL electronic offers cmplete systems with integrated Boundary Scan. These are the SCANTURY® BScan Prober, the SCANTURY® series PXI 50xx Tester Complete Systems as well as our AOI systems OptiCon [AOI – OptiCon]. Don’t hesitate to contact us when you are looking for an integrated solution.
Brochures about the integration of JTAG/Boundary Scan in AOI systems, Flying Prober and In-Circuit-Tester can be downloaded [here] Please test our interactive learning software for IEEE 1149.x, the Boundary Scan Coach which guides you to the basics and application of Boundary Scan/JTAG [Boundary Scan Coach] | |
| You will find brochures, documents and request forms in our download center. |
If you would like to download brochures and other documents please enter your username and password in order to log in on the website.
To top
|
