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Home > JTAG/Boundary Scan > Hardware > SCANFLEX > I/O Modules
 SCANFLEX® I/O Module
| General product information - Can be combined with all available SCANFLEX® components (SCANFLEX® Controllers, SCANFLEX® TAP Transceivers)
- Clustering of SCANFLEX® I/O Modules using Multi-Module Carriers (SFX Carrier)
- Innovative link technique enable distances to I/O Modules to five metres without performance loss with up to three trunks
- Full software support by JTAG/Boundary Scan development environment SYSTEM CASCON™
- Free programming (manual/ATPG) of module functions in mixed signal Boundary Scan programming language CASLAN
- Guaranteed support of future advancements due to highly flexible, typically in-field re-programmable hardware structure
- Advanced, modern system architecture, based on specifically developed technologies (HYSCAN™, VarioCore®, AutoDetect)
- Automatic recognition of SCANFLEX® I/O Modules by AutoDetect mechanism
- Applicable for standard Boundary Scan test, in-system programming (ISP) and in-system configuration (ISC)
- Supports Extended Boundary Scan operations in combination with various other test and programming methodologies
- Control of module functions completely independent of TAP sequences; however, operations can be fully synchronized
- Handy, easily changeable compact unit with defined standard dimensions, shipping with connection cable
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 SFX-1000 – Prototype Module
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| Product features
- Can be 1149.1 TAP synchronized (HYSCAN™)
- On-board interface CPLD
- Programmable functions
- Breadboard area for customer-specific circuits
- Pin header for individual signal contacting
| Target applications on board and system level - Analog, digital, and mixed signal applications
- Carrier module for conditioned plug-on boards
- Basis for customer-specific SCANFLEX® engineering by GÖPEL electronic
- Implementation of all types of customer-specific circuits as functional module or for signal conditioning
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SFX-5296 – Digital I/O Module
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| Product features - Can be 1149.1 TAP synchronized (HYSCAN™)
- 96 independent, single ended channels
- Channels can be configured as In / Out / Bidir / Tristate
- 32x3 channels voltage programmable
- I/O voltage 1.8 - 4.5 V programmable (5 V tolerant)
- Hotswap feature
- Increased current yield (24mA) / CH
- CION™ based I/O protection
| Target applications on board and system level - Test of non BScan clusters without netlist merging
- Test of connectors without netlist merging
- Test of backplanes without netlist merging
- Test of wirings without netlist merging
- Static digital verifications
- External control of functional pins
- Static digital functional tests
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SFX-5350– Differential I/O Module
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| Product features - Can be 1149.1 TAP synchronized (HYSCAN™)
- 50 independent differential channels
- Channels can be configured as I/O/Bidir
- Scalable scheduling
- External signal conditioning slot
- Integrated VarioCore® technology
- Support of medium size VarioCore®-IP
- Enables I/O frequencies up to 125 MHz
| Target applications on board and system level - Test of connectors without netlist merging
- Test of backplanes without netlist merging
- Static digital functional tests
- Flexible functionality by VarioCore®-IP:
- Structural At-Speed Tests
- Dynamic Clustertest
- High Speed Flash programming
- Multitude of further applications
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SFX-5704 – Mixed Signal I/O Module
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| Product features - Can be 1149.1 TAP synchronized (HYSCAN™)
- Four independent mixed signal channels
- Channels can be configured as In / Out / Bidir / Tristate
- Programmable output voltage ±10V
- Programmable input Voltage ±10V
- Programmable Pull Up / Pull Down
- Programmable driver current (up to 0.3 A)
- Clipp-circuit (limiter) per channel
- 12 bit ADC per channel
- Interposing relay for each channel
| Target applications on board and system level - Test of mixed signal clusters
- Test of interface connectors
- Test of non BScan structures
- Static analog and digital verifications
- External control of functional pins
- Measuring of analog voltages
- Back driving of analog and digital signals via longer cables (Flying Prober)
- Static mixed signal functional tests
- Diagnostic of faults in mixed signal structures
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SFX-6216– Analog Input Module
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| Product features - Can be 1149.1 TAP synchronized (HYSCAN™)
- 16 channels based on 4 x 4 multiplexing
- 4 times ADC with 12 bit resolution
- Scan rate250 kSPS
- Programmable measuring range to 50 V
- Bipolar inputs
- Input impedance > 1 MOhm
- External trigger channels
- VarioCore® Support
| Target applications on board and system level - Test of IEEE1149.4 interconnections
- Test of analog interconnections
- Test of analog connectors
- Test of analog components
- Test of analog clusters
- Supply voltage metering
- Static analog verifications
- Static analog functional tests
- Dynamic measuring functions via VarioCore®
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SFX-6308 – Analog I/O Module
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| Product features - Can be 1149.1 TAP synchronized (HYSCAN™)
- 8 independent I/O channels
- 4 output channels with extended current yield of up to 200mA at ± 10V
- 4 bipolar input channels with a range of ± 10V
- 8 channels based on 4 x 4 multiplexing
- 4 times ADC with 12 bit resolution
- Scan rate250 kSPS
- Programmable measuring range to 50 V
- Bipolar inputs
- Input impedance > 1 MOhm
- External trigger channels
- VarioCore® Support
| Target applications on board and system level - Test of IEEE1149.4 interconnections
- Test of analog interconnections
- Test of analog connectors
- Test of analog components
- Test of analog clusters
- Supply voltage metering
- Static analog verifications
- Static analog functional tests
- Dynamic measuring functions via VarioCore®
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SFX-1149.4 – Analog Test Bus I/O
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| Product features - IEEE 1149.4 compliant
- Can be 1149.1 TAP synchronized (HYSCAN™)
- 1 x ATAP (AT1, AT2)
- RLC measuring functions
- AC voltage metering
- DC voltage metering
- Ramp function
- Digitizer function
| Target applications on board and system level - Test of IEEE1149.4 structures
- Test of analog interconnections
- Test of analog interface connectors
- Test of analog components
- Test of analog clusters
- Analog voltage metering
- Static analog verifications
- Static analog functional test
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I/O Modules
