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    PXI Bus - Compact Version

    SCANFLEX® Controller for PXI Bus with integrated TAP Transceiver -  Compact Version 2TAP(C2) or 4TAP(C4)

    General product information

    • Compliant with PCI standard specification revision 2.2
    • Provides Local Bus Interface and supports entire PXI Trigger Bus
    • Compliant with IEEE1149.1, IEEE1149.4, IEEE1149.6, IEEE1532, JESD71 (STAPL), SVF (Serial Vector Format)
    • Compact Controller with integrated TAP Transceiver (2TAP/4TAP)
    • Can be combined with all available SCANFLEX® I/O Modules
    • Full software support by JTAG/Boundary Scan development environment SYSTEM CASCON™
    • Guaranteed support of future advancements due to highly flexible, in-field re-programmable system hardware and hardware functions
    • Leading system architecture, based on specifically developed technologies (SPACE™, ADYCS™, HYSCAN™, FASTSCALE™, AutoDetect )
    • Test programs and ISP scripts are cross compatible with all Boundary Scan controllers from GÖPEL electronic
    • Applicable for Standard Boundary Scan test, in-system programming (ISP) and in-system configuration (ISC)
    • Supports Extended Boundary Scan operations in combination with various other test and programming methodologies
    • Simple integration in PXI Express systems based on preconfigured plug-ins (NI LabView, NI LabWindows, and NI TestStand)
    • Highly flexible front-end because of on board TAP Interface Card (TIC), with exchangeable Paddle Cards and integrated analog / digital add-on resources
    • Automatic recognition of transceiver type, number of TAPs and configuration by AutoDetect mechanism
    • Universal solution for configuration of stand-alone bench-top systems in laboratory, production and service
    • Handy, compact unit shipping with TAP and PIO cables

     

    If you are interested in detailed information please [contact] us.

     SFX/PXI1149/Cx-A – JTAG/Boundary Scan Controller for medium performance

    Product feature

    • ADYCS™ II (Active Delay Compensation)
    • HYSCAN™ (Hybrid Scan)
    • FASTSCALE™ (Fast Performance Scaling)
    • Scan Data Buffer (TDI/TDO Cache)
    • Supports 2/4 parallel, independent TAP
    • TCK frequency range DC - 20 MHz
    • TCK step width 250Hz

    Per TAP programmable parameter

    • Output voltage 1.8 – 4.5 V
    • Input threshold 0 to 3V / 5V tolerant
    • Input and output impedance
    • TDI delay (ADYCS™ II)
    • Relay switched output line
    • TCK frequency range DC - 80 MHz
    • Hot Plug feature incl. TAP protection

    Target applications on board and system level

    • In-system configuration of PLD/FPGA
    • In-system programming of Flash < 1Mbit
    • On-chip Flash programming < 1Mbit
    • Test of units up to medium complexity
    • Control of complex self tests (BIST)
    • Static mixed signal test / verifications
    • Gang programming/ gang test

    Special add-on resources

    • Dynamic 32 bit PIO with programmable I/O voltage
    • Two analog I/O channels (10 bit ADC/DAC)
    • Static 3 bit PIO for event handling
    • Trigger channels for external instruments
    • SFX/LS upgrade interface for I/O Modules

     SFX/PXI1149/Cx-B – JTAG/Boundary Scan Controller for high performance

    Product features

    • ADYCS™ II (Active Delay Compensation)
    • HYSCAN™ (Hybrid Scan)
    • FASTSCALE™ (Fast Performance Scaling)
    • SPACE™ II scan architecture
    • Supports 2/4 parallel, independent TAP
    • TCK frequency range DC - 50 MHz
    • TCK step width 250Hz / 1MHz

    Per TAP programmable parameter

    • Output voltage 1.8 – 4.5 V
    • Input threshold 0 to 3V / 5V tolerant
    • Input and output impedance
    • TDI delay (ADYCS™ II)
    • Relay switched output line
    • TCK frequency range DC - 80 MHz
    • Hot Plug feature incl. TAP protection

    Target applications on board and system level

    • In-syste configuration of PLD/FPGA
    • High Speed ISP of Flash > 1Mbit
    • On Chip Flash programming > 1Mbit
    • Test of units up to high complexity
    • Control of complex self tests (BIST)
    • Static mixed signal test / verifications
    • Gang programming / gang test

    Special add-on resources

    • Dynamic 32 bit PIO with programmable I/O voltage
    • Two analog I/O channels (10 bit ADC/DAC)
    • Static 3 bit PIO for event handling
    • Trigger channels for external instruments
    • SFX/LS upgrade interface for I/O Modules

     SFX/PXI1149/Cx-C – JTAG/Boundary Scan Controller for ultra high performance

    Product features

    • ADYCS™ II (Active Delay Compensation)
    • HYSCAN™ (Hybrid Scan)
    • FASTSCALE™ (Fast Performance Scaling)
    • SPACE™ II-S scan architecture
    • Supports 2/4 parallel, independent TAP
    • TCK frequency range DC - 80 MHz
    • TCK step width250Hz / 1MHz

    Per TAP programmable parameter

    • Output voltage 1.8 – 4.5 V
    • Input threshold 0 to 3V / 5V tolerant
    • Input and output impedance
    • TDI delay (ADYCS™ II)
    • Relay switched output line
    • TCK frequency range DC - 80 MHz
    • Hot Plug feature incl. TAP protection

    Target applications on board and system level

    • On-chip Flash programming > 1Mbit
    • System-in-package (SIP) test
    • Control of complex self tests (BIST)
    • static mixed signal tests
    • Dynamic functional verifications
    • Test of dies
    • Gang programming / gang test

    Special add-on resources

    • Dynamic 32 bit PIO with programmable I/O voltage
    • Two analog I/O channels (10 bit ADC/DAC)
    • Static 3 bit PIO for event handling
    • Trigger channels for external instruments
    • SFX/LS upgrade interface for I/O Modules

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