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Home > JTAG/Boundary Scan > Hardware > SCANFLEX > Controller > PXI Bus FXT Compact Version
 SCANFLEX® Controller for PXI Bus with integrated TAP Transceiver for Fixture Applications - Compact Version 4TAP(C4-FXT)
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 | General product information - Compliant with PCI standard specification revision 2.2
- Provides Local Bus Interface and supports entire PXI Trigger Bus
- Compliant with IEEE1149.1, IEEE1149.4, IEEE1149.6, IEEE1532, JESD71 (STAPL), SVF (Serial Vector Format)
- Compact Controller with integrated FXT-TAP Transceiver (4TAP)
- Highly flexible front-end with external differentially coupled TAP Interface Cards (TIC), Paddle Cards and integrated analog / digital add-on resources
- Can be combined with all available SCANFLEX® components (SCANFLEX® TAP Transceivers, SCANFLEX® I/O Modules)
- Full software support by JTAG/Boundary Scan development environment SYSTEM CASCON™
- Guaranteed support of future advancements due to highly flexible, in-field re-programmable system hardware and hardware functions
- Leading system architecture, based on specifically developed technologies (SPACE™, ADYCS™, HYSCAN™, FASTSCALE™, AutoDetect )
- Test programs and ISP scripts are cross compatible with all Boundary Scan controllers from GÖPEL electronic
- Applicable for Standard Boundary Scan test, in-system programming (ISP) and in-system configuration (ISC)
- Supports Extended Boundary Scan operations in combination with various other test and programming methodologies
- Simple integration in PXI Express systems based on preconfigured plug-ins (NI LabView, NI LabWindows, and NI TestStand)
- Automatic recognition of transceiver type, number of TAPs and configuration by AutoDetect mechanism
- Universal solution for configuration of stand-alone bench-top systems in laboratory, production and service
- Handy, compact unit shipping with TAP and PIO cables
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If you are interested in detailed information please [contact] us.
 SFX/PXI1149/C4-FXT-A – JTAG/Boundary Scan Controller for medium performance
| Product feature - ADYCS™ II (Active Delay Compensation)
- HYSCAN™ (Hybrid Scan)
- FASTSCALE™ (Fast Performance Scaling)
- Scan Data Buffer (TDI/TDO Cache)
- Supports 4 parallel, independent TAP
- TCK frequency range DC - 20 MHz
- TCK step width 250Hz
| Target applications on board and system level - In-system configuration of PLD/FPGA
- In-system programming of Flash < 1Mbit
- On-chip Flash programming < 1Mbit
- Test of units up to medium complexity
- Control of complex self tests (BIST)
- Static mixed signal test / verifications
- Gang Programming / Gang Test
| Per TAP programmable parameter - Output voltage 1.2 to 3.6 V (internal / external)
- Input voltage 0 to 3 V (internal / external)
- TDI delay (ADYCS II™)
- Exchangeable Line Driver Module (LDM)
- Relay switched output line
- Breaker relays for TAP (TIC02/SR)
- TCK frequency range DC - 80 MHz
- Hot Plug feature incl. TAP protection
| Special add-on resources - Dynamic 32 bit PIO with programmable I/O voltage
- Two analog I/O channels (10 bit ADC/DAC)
- Static 3 bit PIO for event handling
- Trigger channels for external instruments
- SFX/LS upgrade interface for SCANFLEX® I/O Modules
- 4 external differentially coupled TIC
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SFX/PXI1149/C4-FXT-B – JTAG/Boundary Scan Controller for high performance
| Product features - ADYCS™ II (Active Delay Compensation)
- HYSCAN™ (Hybrid Scan)
- FASTSCALE™ (Fast Performance Scaling)
- SPACE™ II scan architecture
- Supports 4 parallel, independent TAP
- TCK frequency range DC - 50 MHz
- TCK step width 250Hz / 1MHz
| Target Applikationen auf Board- und Systemlevel - In-system configuration of PLD/FPGA
- High Speed ISP of Flash > 1Mbit
- On Chip Flash programming > 1Mbit
- Test of units up to high complexity
- Control of complex self tests (BIST)
- Static mixed signal test / verifications
- Gang programming / gang test
| Pro TAP programmable Parameter - Output voltage 1.2 to 3.6 V (internal / external)
- Input voltage 0 to 3 V (internal / external)
- TDI delay (ADYCS II™)
- Exchangeable Line Driver Module (LDM)
- Relay switched output line
- Breaker relays for TAP (TIC02/SR)
- TCK frequency range DC - 80 MHz
- Hot Plug feature incl. TAP protection
| Special add-on resources - Dynamic 32 bit PIO with programmable I/O voltage
- Two analog I/O channels (10 bit ADC/DAC)
- Static 3 bit PIO for event handling
- Trigger channels for external instruments
- SFX/LS upgrade interface for SCANFLEX® I/O Modules
- 4 external differentially coupled TIC
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SFX/PXI1149/C4-FXT-C – JTAG/Boundary Scan Controller for ultra high performance
| Product features - ADYCS™ II (Active Delay Compensation)
- HYSCAN™ (Hybrid Scan)
- FASTSCALE™ (Fast Performance Scaling)
- SPACE™ II-S scan architecture
- Supports 4 parallel, independent TAP
- TCK frequency range DC - 80 MHz
- TCK step width250Hz / 1MHz
| Target applications on board and system level - On-chip Flash programming > 1Mbit
- System-in-package (SIP) test
- Control of complex self tests (BIST)
- static mixed signal tests
- Dynamic functional verifications
- Test of dies
- Gang programming / gang test
| Per TAP programmable parameter - Output voltage 1.2 to 3.6 V (internal / external)
- Input voltage 0 to 3 V (internal / external)
- TDI delay (ADYCS II™)
- Exchangeable Line Driver Module (LDM)
- Relay switched output line
- Breaker relays for TAP (TIC02/SR)
- TCK frequency range DC - 80 MHz
- Hot Plug feature incl. TAP protection
| Special add-on resources - Dynamic 32 bit PIO with programmable I/O voltage
- Two analog I/O channels (10 bit ADC/DAC)
- Static 3 bit PIO for event handling
- Trigger channels for external instruments
- SFX/LS upgrade interface for SCANFLEX® I/O Modules
- 4 external differentially coupled TIC
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PXI Bus FXT Compact Version