Scan Booster/PCI, Scan Booster/USB and Scan Booster/USB-FXT for JTAG/Boundary Scan test - GÖPEL electronic GmbH

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Scan Booster

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Scan Booster

The Scan Booster™ Family

The Scan Booster™ product family complements the existing spectrum of SCANFLEX® solutions by an independent product range in the lower to mid-range performance area.

Available family members are Scan Booster/PCI, Scan Booster/USB and Scan Booster/USB-FXT, JTAG/Boundary Scan controllers on PCI bus and USB2.0 basis, respectively, for JTAG/Boundary Scan test, (C)PLD/FPGA programming and FLASH In-System programming with limited amount of data.
The controller range provides optimal solutions in particular for standard applications with high cost pressure and lower performance requirements.

Scan Booster/USB
	The Scan Booster/USB is equipped with two separate and independent TAPs and supports a programmable TCK frequency up to 16MHz. Both TAPs are independently programmable with regard to output voltage, input voltage, output impedance and input impedance. By utilizing GÖPEL electronic’s TIC (TAP Interface Card) modules serving as interface between controller and UUT, some of the SCANFLEX® advantages apply. The controller offers additional resources such as 32bit Parallel I/O (dynamic), two analogue I/O, three generic digital I/O as well as three trigger signals.

ScanBooster/USB-FXT
	The Scan Booster/USB-FXT is equipped with two fully independent TAPs and supports a programmable TCK frequency up to 16MHz. Both TAPs use externally controlled active test heads (exclusively). The distance between the controller and TAP head can be up to 4m/12ft without loss of performance. Exteneral TAP heads such as TIC02/03 offer programmable input and output voltage and isolation relays. For applications where difficult access problems are encountered for instance thermal and vibration testing, the TIC03 is available with extended temperature range. It was particularly developed for HASS/HALT applications. More information about available TICs can be found [here]. By utilizing the various TIC modules as an interface between the transceiver and UUT, this enables the advantages of the SCANFLEX® architecture. The transceiver offers additional resources such as 32bit Parallel I/O (dynamic), two analogue I/O, three generic digital I/O as well as three trigger signals.

The Scan Booster/USB interface is compatible to any SCANFLEX® SFX-TAP(x) Desktop-Transceiver. Developed test programs are cross compatible and can be executed without re-compilation. The Scan Booster/USB-FXT is completely supported by the industry leading Boundary Scan software SYSTEM CASCON©. SYSTEM CASCON© is the only integrated development environment using a JTAG/Boundary Scan programming language (CASLAN) for IEEE 1149.1 / IEEE 1149.4 / IEEE 1149.6 / VarioCore® and more than 30 tools for automated test program generation (ATPG), pin failure diagnostics (PFD), In-System programming (ISP), as well as extensive verification by debugging at schematic and layout level.

Scan Booster/PCI

Scan Booster/PCI

The ScanBooster/PCI is equipped with two separate TAP and supports a programmable TCK frequency of maximal 16MHz. Both TAP are independently programmable with regard to output voltage, input voltage, output impedance and input impedance. By utilizing GÖPEL electronic’s CION™ ASICs as driver circuit, the TAP have outstanding good signal integrity in combination with special features for interface protection. The controller offers additional resources such as dynamic 32bit Parallel I/O, trigger signals, an SCP bus for system extensions and a specific interface for parallel gang testing of up to eight UUT.

ScanBooster/PCI is interface compatible to former hardware generations. Previously developed test programs can be cross compatible on each SCANFLEX^® platform without recompilation.

The ScanBooster/PCI is completely supported by the industry leading Boundary Scan software SYSTEM CASCON™. SYSTEM CASCON™ is the only integrated development environment with a specific Mixed Signal Boundary Scan programming language (CASLAN) for IEEE 1149.1/IEEE 1149.4 including more than 30 tools for the automated test program generation (ATPG), pin failure diagnostic (PFD), in-system programming (ISP) as well as extensive verification through debugging at schematic and layout level.

BST Signal Access Board (Options for Scan Booster/PCI)

BST Signal Access Board (Options for Scan Booster/PCI)

The BST Signal Access Board has been developed for fast adaptation of a JTAG/Boundary Scan UUT to a first generation JTAG/Boundary Scan controller from GÖPEL electronic. It can not be used with SCANFLEX^®. However, the interface is fully compliant to the Scan Booster/PCI and therefore the BST Signal Access Board can be used as well. All signals can be accessed via low-profile headers.

The BST Signal Access Board facilitates the contacting of the UUT. It also allows immediate connection of prototypes via clips. Additional LEDs visualizing the TAP signal states provide fast test bus verification.

Gang Access Pod
	The Gang Access Pod has been developed for simultaneous testing and programming several UUTs. It provides 8 separately buffered ports that can be enabled and disabled individually. Besides the TAP, 10 more I/O signals and two operating voltages are available per port. Since TAP interface voltages can be defined, the Gang Access Pod supports various logic families down to 1.8V. At the same time it is 5V tolerant. The Gang Access Pod has been developed for first generation JTAG/Boundary Scan controllers from GÖPEL electronic. It can not be used with SCANFLEX^®. However, the interface is fully compliant to the Scan Booster/PCI and therefore the GNAG Access Pod can be used as well. If required, the Gang Access Pod can be integrated in a fixture.

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