Das CION Module™/PCIe-x4 enables structural Test coverage of x4 PCI Express Slots via IEEE1149.1./6. The module is based GOEPEL's custom CION™ ASIC ICs coupled with differential test channels. The low-cost module is plugged directly into the tested PCI Express slot and controlled by means of a TAP (Test Access Port). Because of on-board IEEE1149.1 und IEEE1149.6 test channels all high speed signal pins, low speed signal pins and voltage supply pin of PCI Express 1.x and 2.0 compliant connectors are structurally testable.  

CION Module™/PCIe-x4
	Highlights: Testing of non Boundary Scan digital parts such as  backplanes and motherboards Test channels with IEEE1149.1 and IEEE1149.6 Std. Test fo all PCI Express connections Powered by proprietary CION™ testability ASIC Multiple modules can be cascaded (daisy-chained)