The CION Module™/FXT192A was specifically developed for the integration in test fixtures. The module is based on GOEPEL electronic's custom CION ASIC ICs and the comprehensive analogue complex. The module enables extended JTAG/Boundary Scan test coverage for non Boundary Scan digital circuit clusters and edge connectors and, additionally, multiple analogue tests and voltage measurements. Each digital channel can be independently programmed as input, output, bi-directional or tri-state. All test channels provide an increased driver current and "unstress" protection feature to avoid interface damages by extended fault currents. The configuration of the analogue complex is wide-banded. Furthermore, the module provides extra resources for circuit voltage and triggering external actors/sensors e.g. switcher, LED, relays etc. The CION Module™/FXT192A is cascadable and can be hot swapped.
CION Module™/FXT192A
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Testing of non Boundary Scan digital parts such as circuit clusters, edge connectors or backplanes -
Testing of analogue parts like ADC or DAC, digital resistors, measurement of on board voltages -
192 digital I/O channels powered by proprietary CION™ testability ASIC -
Groups of 32 channels are voltage programmable between 1.8 to true 5V -
Per pin individual programmable channels (direction) -
Driver capability per channel +-24mA -
Special protection features such as unstress -
16 analogue input channels (12bit) with configurable input voltage range -
8 analog output channels (12bit) with configurable output voltage range -
3 Open Collector outputs -
4 opto isolated I/O channles -
2 DPST Relays for switching up to 5A per contact -
Programmable TAP voltage for the module JTAG interface -
Multiple modules can be cascaded
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CION Module/FXT192A