The CION Module™/FXT114S was specifically developed for the integration in test fixtures and enables the structural test of high-speed differential interfaces with IEEE-Std. 1149.1 compliant test resources. The digital low-cost module provides 114 parallel I/O channels with IEEE-Std. 1149.1. 50 of those channels also support IEEE-Std. 1149.6. The CION Module™/FXT114S provides 64 single-ended test channels, controlled by GOEPEL electronic's CION™ ASIC devices. All channels are independently controllable as Input/Output/Tristate and the I/O voltage can be programmed in groups. Special safety measures, such as the CION's ‘UNSTRESS’ feature, protect the Unit Under Test (UUT) against damage in case of shorts.

 

CION Module™/FXT114S
	Highlights: Testing of non Boundary Scan digital parts such as circuit clusters, edge connectors or backplanes in fields of Telecommunication, Embedded Control, Automotive and Aerospace 114 parallel test channels with IEEE-Std. 1149.1 64 Single Ended test channels supported by CION™ ASIC Programmable voltage from 1.8V to 5V in groups of 32 channels Special protection features such as unstress 50 LVDS channels with IEEE1149.1 and IEEE1149.6-Std.: 25 Input channels 25 Output channels Multiple modules can be cascaded (daisy-chained)