During the development of the CION™ technology, GOEPEL electronic focused on customer recommendations for a new generation of economical, yet flexible JTAG/Boundary Scan modules for installation into active test fixtures. Utilizing the unique CION™ technology, an extremely efficient solution can be offered. In combination with the integrated JTAG/Boundary Scan workbench SYSTEM CASCON™, this solution provides extended fault isolation accompanied by excellent pin level fault diagnostics.
CION™
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| The CION™ (Configurable I/O Network) is a universal Parallel I/O ASIC with special JTAG/Boundary Scan test features. Applying one of the 4 functional modes it can both be used to improve on-board testability or to create external test adapters. Its 32 I/O signals are divided into 4 independent 8bit ports. Due to the wide I/O voltage range, a large number of logic families are supported. Every channel can independently be set to input, output, bi-directional or in high-impedance state. The output buffers are able to drive high currents and are equipped with an unstress feature for UUT and CION ™ protection and hotswap capability. Highlights: - IEEE Std 1149.1 compliant ASIC
- 3 functional I/O modes or pure JTAG/Boundary Scan
- Simultaneous stimulation/observation of each test channel
- High output level current efficiency (IOL) 32mA, (IOH) 24mA@3.3V
- Hotswap support
- Increase testability by on-board application or create universal external test adapters
- Designed for test of non-scanable nets and clusters, edge connectors, backplanes, cables, ICs and multi-chip-modules
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CION 