IEEE 1149.1 Testability Devices / Testability Modules / Programming Pods

JTAG/Boundary Scan as an innovative DfT method requires respective scanable components on the unit under test (UUT) for its application. Yet, this cannot always sufficiently be realized in practice, as, for example, edge connectors do not provide such features. Another problem is that not all types of components are available as scanable devices, therefore non-scanable clusters are unavoidable. Both problems can be solved or at least alleviated by following hardware.

[CION™]

[ADC/FXT 10]

[Programming POD]