Boundary Scan Probe

The Boundary Scan Probe serves as a handheld tool for debugging of UUTs and JTAG/Boundary Scan devices. It basically is a virtual JTAG/Boundary Scan pin providing several advantages, e.g. static and dynamic logic pen functionality. Probe the test object (UUT) using the second 10pin TAP connector and/or via spring loaded test tip. An LED illuminates the contact area. The Boundary Scan Probe is especially useful during prototype testing, repair and troubleshooting, as well as for verification of a BSDL file against the physical implementation of JTAG/Boundary Scan resources on respective silicon. Current limitation circuitry built in to the probe protects the UUT against overloading. An internal probe control circuitry provides measure (low, midrange, high), static Drive Low, static Drive High, and toggle Drive Low/High functionality, with driven and measured levels being indicated via separate LED’s. Pull-up and pull-down functions complement the driving capabilities. The device can be powered by a JTAG/Boundary Scan controller as well as by an internal battery.

 

Highlights

LVTTL technology Static and dynamic measurement and visualization of Low and High level as well as TriState Driving of low or high level, static or as pulse; Adjustable driver current External or internal (battery) power supply (Auto Power Off feature) Compact handheld case with illuminated spring loaded test tip Over-current protection Test program for the verification of JTAG/Boundary Scan ICs (BSDL check) on register and pin level included (in CASLAN) Simple integration in an existing IEEE 1149.1 compliant JTAG/Boundary Scan test Emulation of a Test Access Port (TAP) for examination of unknown JTAG/Boundary Scan IC implementations Designed for use in laboratory (prototyping/debugging) and field service as well as repair applications