Choose a language
JTAG/Boundary Scan
Home > JTAG/Boundary Scan > Integration > In Circuit Test

In Circuit Test (ICT)

In-Circuit-Test (ICT) with JTAG/Boundary Scan

In-Circuit-Test (ICT) with JTAG/Boundary Scan
In-Circuit-Test (ICT) with JTAG/Boundary Scan

JTAG/Boundary Scan integration in In-Circuit-Test (ICT) systems

In-Circuit-Test (ICT) is the most widespread technology at present because the principle allows all electrically detectable faults to be found. But its capability is becoming limited by access difficulties since components have become smaller, and because of more complex narrow width nets and multi-layer boards.

Boundary Scan does not have access limitations. A combination is beneficial whenever mechanical access is difficult even though there may be a small number of Boundary Scan components on the PCB.

Advantages:

  • Very fast total system
  • Very high fault coverage also for highly compact PCBs
  • Reduction of nail bed adapter costs
  • Simple test program generation because each test technology is applied according to its core competence

Third party ATE partner

Aeroflex 42x0, 52x0 and 53x0 series

Aeroflex

The SCANFLEX JTAG/Boundary Scan hardware supports the Aeroflex 42x0, 52x0 and 53x0 series of In-Circuit-Test from Aeroflex.

With this Boundary Scan implementation, a multitude of additional test options is available for the users on board and system level over the complete product life cycle without invasive access of the nail bed. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

Aeroflex’ tester platform supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY® software.

Integration example for Aeroflex Tester 4200

Integration in Aeroflex Tester 4200

Combination of Aeroflex Tester 4200 with SCANFLEX Hardware

  • Controller SFX/PCI1149
  • TAP Transceiver SFX-TAP4/FXT
  • TAP Interface Card TIC02/SR

and Software:

  • CASCON GALAXY® 4.x for Aeroflex

JTAG/Boundary Scan Integration in Agilent series 3070

Agilent

The SCANFLEX JTAG/Boundary Scan hardware supports series 3070 of In-Circuit-Tester from Agilent.

The integrated Boundary Scan hardware consists of PCI Controller and TAP Transceiver. The architecture of the controller supports data rates up to 80 MHz at up to four independent TAP. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market

The test platform of Agilent’s 3070 series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for series 3070 from Agilent

Boundary Scan Integration in Agilent 3070 Tester

Combination of Agilent Tester 3070/i5000 with SCANFLEX Hardware:

  • Controller SFX/PCI1149
  • SFX-TAP4/3070-PIC for Pin Slot

and Software:

  • CASCON GALAXY 4.x for Agilent 3070

Agilent 3070 - Utility Card Module UCM3070/x

Die UCM3070/x ist eine professionelle JTAG/Boundary-Scan-Option, welche speziell für die Utility Card von Agilent entwickelt wurde. Der auf der SCANBOOSTER™-Architektur basierende TAP-Controller hat zwei unabhängig voneinander programmierbare TAPs, zwei Bänke mit jeweils 4 PIPs und eine Selbsttestfunktionalität. Zwei PIP-Signale können als analoge Kanäle zum Treiben und Messen analoger Werte während der Testerstellung mit SYSTEM CASCON™ benutzt werden.

Boundary Scan solution for Agilent’s Utility Card in Medalist ICT
  • Boundary Scan solution for Agilent’s Utility Card in Medalist ICT
  • Official proofed system integration by Agilent and GOEPEL electronic
  • Easy to mount and full documented SYSTEM CASCON™ quick installation
  • Extended self test feature for simple system check
  • SCANBOOSTER™ architecture controlled by USB 2.0 high speed
  • Two test access ports (TAP), eight parallel interface ports (PIP) and two analogue channels
  • On-board power management to use Agilent’s power supply

JTAG/Boundary Scan Integration in Digitaltest MTS series

Digitaltest

Digitaltest MTS 30/180/300/888 series

The JTAG/Boundary Scan hardware platform SCANFLEX supports Digitaltest MTSxx board tester of the type In-Circuit Test.

The integrated Boundary Scan hardware consists of a PCI controller, a TAP transceiver and the TAP Interface Card (TIC). The architecture of the controller supports data rates up to 80 MHz at up to four independent TAP. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

One highlight of this integration is the software-related activation of the Digitaltest In-Circuit tester’s test channels.
Due to this Boundary Scan tests can be carried out on the adapter of the Digitaltest machine with interaction of Boundary Scan IC and In-Circuit tester.

The tester platform of Digitaltest’s MTSxx series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for Digitaltest Tester MTS888

Integration example for Digitaltest Tester MTS888

Combination of Digitaltest Tester MTS888 with SCANFLEX hardware

  • Controller SFX/PCI1149
  • TAP Transceiver SFX-TAP4/FXT
  • TAP Interface Card TIC02/SR

and Software:

  • CASCON GALAXY 4.x for Digitaltest MTS888

JTAG/Boundary Scan Integration in Rohde & Schwarz TSVP series

Rohde and Schwarz

The JTAG/Boundary Scan hardware platform SCANFLEX supports multi configurational and/or multi functional ATE systems of Rohde & Schwarz testers series TSVP.

The integrated Boundary Scan hardware for the TSVP systems consists of a PXI compact controller with paddle card and the TAP Interface Card TIC02SR.

The architecture of the controller supports data rates up to 80 MHz at up to four independent TAPs with additional resources.

Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.

Integration example for Rohde & Schwarz TSVP Tester

JTAG/Boundary Scan Integration in TSVP Tester

Combination of the multi functional PXI testers TSVP by Rohde & Schwarz with SCANFLEX hardware

  • Controller SFX/PXI1149/C4-FXT
  • TAP Interface Card TIC02/SR

and Software

  • CASCON GALAXY 4.x for Rohde & Schwarz TSVP

JTAG/Boundary Scan Integration in SPEA series

Spea

The JTAG/Boundary Scan hardware platform SCANFLEX supports SPEA 3030 board tester of the type In-Circuit Test.

The integrated Boundary Scan hardware consists of a PCI controller and Fixture Transceiver with TAP Interface Cards (TIC). The architecture of the controller supports data rates up to 80 MHz at up to four independent TAPs. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

One highlight of this integration is the software-related activation of the SPEA In-Circuit tester’s test channels.
Due to this Boundary Scan tests can be carried out on the adapter of the SPEA machine with interaction of Boundary Scan IC and In-Circuit tester.

The tester platform of SPEA’s 3030 series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for SPEA 3030

JTAG/Boundary Scan integration in SPEA 3030

Combination of SPEA Tester 3030 with SCANFLEX Hardware:

  • Controller SFX/PCI1149
  • TAP Transceiver SFX-TAP4/FXT
  • TAP Interafce Card TIC02/SR

and Software:

  • CASCON GALAXY 4.x for SPEA 3030 from GOEPEL electronic

JTAG/Boundary Scan Integration in TERADYNE tester

TERADYNE

Teradyne TSSE/Spectrum 88xx series 

The JTAG/Boundary Scan hardware platform SCANFLEX supports TERADYNE’s Spectrum series of the type In-Circuit Test.

One highlight of this integration is the software-related activation of the TERADYNE In-Circuit tester’s test channels. Due to this Boundary Scan tests can be carried out on the adapter of the TERADYNE machine with interaction of Boundary Scan IC and In-Circuit tester.

The tester platform of TERADYNE’s 88xx series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for Teradyne Testers Spectrum 88xx/TSSE

Boundary Scan Integration in Teradyne Tester 88xx

Combination of TERADYNE tester Spectrum 88xx/TSSE with SCANFLEX hardware

  • Controller SFX/PCI1149
  • SFX-TAP8/88x-PIC for Pin Slot
  • TAP Interafce Card TIC02/SR

and Software:

  • CASCON GALAXY 4.x for TERADYNE 88xx

Teradyne tester TestStation TS12x LH/LX and previous Genrad tester 228x series

The JTAG/Boundary Scan hardware platform SCANFLEX supports TERADYNE’s TestStation board tester (In-Circuit Test).

The test platform of TERADYNE’s TS12x  series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for Teradyne Testers GR228x/TSLH/TS12x/TS8x

JTAG/Boundary Scan integration in Teradyne Tester TestStation

Combination of TERADYNE Tester GR228x/TSLH/TS12x/TS8x with SCANFLEX hardware

  • controller PCI
  • SFX-TAP8/228x-PIC for Pin Slot
  • TAP Interafce Card TIC02/SR

and Software:

  • CASCON GALAXY 4.x for TERADYNE 228xx
GOEPEL electronics Ltd., Unit 1A, The Old Granary, Westwick, Cambridge, CB24 3AR
Phone +44-1223-858298, Fax +44-1223-257800, www.goepel.co.uk