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Flying Probe Test (FPT)

Flying Probe test (FPT) systems combined with JTAG/Boundary Scan

Integration of JTAG/Boundary Scan in Flying Probe Tester (FPT)
Integration of JTAG/Boundary Scan in Flying Probe Tester (FPT)

JTAG/Boundary Scan integration in Flying Probe test (FPT) systems

As an outstanding integration partner, GÖPEL electronic is highly experienced in this area and has been working very closely and successfully with well-known vendors of Flying Probers for many years.

The Flying Probe test’s disadvantage, its execution speed, can be reduced to the lowest level by combining FPT with Boundary Scan.

A particular advantage of this combination is the ability to apply the probes as virtual Boundary Scan cells, allowing traces to be tested which were previously untestable with JTAG/Boundary Scan.

Advantages:

  • Fast total system
  • Very high fault coverage, also for highly complex PCBs
  • High flexibility because no UUT specific adapter is required
  • Easy test program generation using automatic software

Third party ATE partner

JTAG/Boundary Scan integration in Digitaltest MTS500 series

Digitaltest

The JTAG/Boundary Scan hardware platform SCANFLEX supports Digitaltest MTS500 board tester of the type Flying Probe.

With this Boundary Scan implementation, a multitude of additional test options is available for the users on board and system level over the complete product life cycle without invasive access of the nail bed. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

One highlight of this integration is the software-related activation of the Digitaltest Flying Probe test channels.
Due to this Boundary Scan tests can be carried out on the adapter of the Digitaltest machine with interaction of Boundary Scan IC and Flying Probe.

The tester platform of Digitaltest’s MTSxx series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for Digitaltest Tester MTS500

Integration in Digitaltest MTS500

Combination of Digitaltest Tester MTS500 with SCANFLEX hardware:

  • Controller SFX/PCI1149
  • TAP Transceiver SFX/TAP4-CR

and Software:

  • CASCON GALAXY 4.5x for Digitaltest MTS

Integration with Polar Instruments flying probe PCB test and repair system GRS500

Polar Instruments

The JTAG/Boundary Scan hardware platform SCANFLEX supports the Polar Instruments flying probe PCB test and repair system GRS500.

The integrated Boundary Scan hardware consists of PCI Controller, TAP Transceiver and I/O Module. The architecture of the controller supports data rates up to 80 MHz at up to two independent TAPs. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

This jointly developed option complements the Polar Instruments GRS500 Active Test basic module to Boundary Scan test. Stimulate your assemblies with Boundary Scan and use the test probe of the GRS500 to test logic level, switching states and waveforms of circuit nets.

Integration example for Polar GRS500

Boundary Scan Integration in Polar Instruments Flying Probe

Combination of Polar Instruments PCB test and repair system GRS500 with SCANFLEX hardware:

  • Controller SFX/PCI1149
  • TAP Transceiver SFX-TAP2
  • I/O Module SFX-5704
  • Module carrier SFX-Carrier5

and Software:

  • CASCON GALAXY 4.x for Polar GRS500

JTAG/Boundary Scan Integration in Seica Pilot/Aerial

Seica Test Solutions

The SCANFLEX JTAG/Boundary Scan hardware supports Seica series Pilot/Aerial of Flying Probers.

The integrated Boundary Scan hardware consists of a PCI controller, a Fixture Transceiver, and a TAP Interface Card (TIC). The architecture of the controller supports data rates up to 80 MHz at up to four independent TAPs with additional resources. Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.

The tester platform of the Pilot/Aerial series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for Seica Pilot/Aerial Tester

Boundary Scan Integration in Seica Tester

Combination of Seica Pilot/Aerial Tester with SCANFLEX hardware:

  • Controller SFX/PCI1149
  • TAP Transceiver SFX-TAP4/FXT
  • TAP Interface Card TIC02/SR

and Software:

  • CASCON GALAXY 4.5x for Seica Pilot/Aerial from GÖPEL electronic

JTAG/Boundary Scan integration in SPEA 4040/4060 series

Spea

The JTAG/Boundary Scan hardware platform SCANFLEX supports SPEA 4040/4060 Highline/Multimode tester of the type Flying Probe.

With this Boundary Scan implementation, a multitude of additional test options is available for the users on board and system level over the complete product life cycle without invasive access of the nail bed. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

One highlight is the possibility of carrying out interactive tests between Boundary Scan IC and Flying Probes. The software SYSTEM CASCON™ controls the positioning of the probes and uses the functions for driving and measuring the signal levels.

The tester platform of SPEA’s series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for SPEA 4060

integration in spea 4060

Combination of SPEA Tester 4060 with SCANFLEX hardware:

  • Controller SFX/ASL1149
  • TAP Transceiver SFX/TAP4-FXT
  • TAP Interface Card TIC02/SR

and Software:

  •  CASCON GALAXY 4.x for SPEA 4060 from GOEPEL electronic

JTAG/Boundary Scan Integration in TAKAYA APT94xx series

Takaya

The SCANFLEX JTAG/Boundary Scan hardware supports TAKAYA’s APT94xx series of Flying Probers.

The integrated Boundary Scan hardware consists of a PCI controller, a TAP transceiver, and an I/O module SFX-5704. The architecture of the controller supports data rates up to 80 MHz at up to four independent TAP with additional resources. Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.

One highlight is the possibility of carrying out interactive tests between Boundary Scan IC and Flying Probes. The software SYSTEM CASCON™ controls the positioning of the probes and uses the functions (of the I/O module SFX-5704) for driving and measuring the signal levels.

The tester platform of the APT 94xx series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

Integration example for TAKAYA APT94xx

JTAG/Boundary Scan integration in TAKAYA APT94xx

Combination of TAKAYA tester APT94xx with SCANFLEX hardware

  • Controller SFX/PCI1149
  • TAP Transceiver SFX-TAP4/CR
  • I/OModule SFX-5704 

and software:

  • CASCON GALAXY 4.5x for TAKAYA APT94xx
GOEPEL electronics Ltd., Unit 1A, The Old Granary, Westwick, Cambridge, CB24 3AR
Phone +44-1223-858298, Fax +44-1223-257800, www.goepel.co.uk