JTAG/Boundary Scan Integration in TERADYNE tester
Teradyne TSSE/Spectrum 88xx series
The JTAG/Boundary Scan hardware platform SCANFLEX supports TERADYNE’s spectrum board tester of the type In-Circuit Test.
One highlight of this integration is the software-related activation of the TERADYNE In-Circuit tester’s test channels. Due to this Boundary Scan tests can be carried out on the adapter of the TERADYNE machine with interaction of Boundary Scan IC and In-Circuit tester.
The tester platform of TERADYNE’s 88xx series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.
Integration example for Teradyne Testers 88xx/Spectrum/TSSE
Combination of the TERADYNE tester 88xx/Spectrum/TSSE with SCANFLEX hardware controller PCI + SFX TAP Transceiver for the pin slot including GOEPEL electronic’s software CASCON GALAXY 4.5x for TERADYNE 88xx.
Teradyne tester TestStation TS12x LH/LX and previous Genrad tester 228x series
The JTAG/Boundary Scan hardware platform SCANFLEX supports TERADYNE’s TestStation board tester (In-Circuit Test).
The test platform of TERADYNE’s TS12x series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.
Integration example for Teradyne Testers GR228x/TSLH/TS12x/TS8x
Combination of the TERADYNE tester GR228x/TSLH/TS12x/TS8x with SCANFLEX hardware controller PCI + SFX TAP Transceiver for the pin slot including GOEPEL electronic’s software CASCON GALAXY 4.5x for TERADYNE 228xx.
JTAG/Boundary Scan Integration in TERADYNE tester
Teradyne TSSE/Spectrum 88xx series
The JTAG/Boundary Scan hardware platform SCANFLEX supports TERADYNE’s spectrum board tester of the type In-Circuit Test.
One highlight of this integration is the software-related activation of the TERADYNE In-Circuit tester’s test channels. Due to this Boundary Scan tests can be carried out on the adapter of the TERADYNE machine with interaction of Boundary Scan IC and In-Circuit tester.
The tester platform of TERADYNE’s 88xx series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.
Integration example for Teradyne Testers 88xx/Spectrum/TSSE
Combination of the TERADYNE tester 88xx/Spectrum/TSSE with SCANFLEX hardware controller PCI + SFX TAP Transceiver for the pin slot including GOEPEL electronic’s software CASCON GALAXY 4.5x for TERADYNE 88xx.
Teradyne tester TestStation TS12x LH/LX and previous Genrad tester 228x series
The JTAG/Boundary Scan hardware platform SCANFLEX supports TERADYNE’s TestStation board tester (In-Circuit Test).
The test platform of TERADYNE’s TS12x series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.
Integration example for Teradyne Testers GR228x/TSLH/TS12x/TS8x
Combination of the TERADYNE tester GR228x/TSLH/TS12x/TS8x with SCANFLEX hardware controller PCI + SFX TAP Transceiver for the pin slot including GOEPEL electronic’s software CASCON GALAXY 4.5x for TERADYNE 228xx.
