Integration in SPEA In-Circuit tester

SPEA 3030 series ICT

The JTAG/Boundary Scan hardware platform SCANFLEX supports SPEA 3030 board tester of the type In-Circuit Test.

The integrated Boundary Scan hardware consists of a controller (PXI, PCI or USB), a Fixture Transceiver and four TAP Interface Cards (TIC). The architecture of the controller supports data rates up to 80 MHz at up to eight independent TAP. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

One highlight of this integration is the software-related activation of the SPEA In-Circuit tester’s test channels.
Due to this Boundary Scan tests can be carried out on the adapter of the SPEA machine with interaction of Boundary Scan IC and In-Circuit tester.

The tester platform of SPEA’s 3030 series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

The JTAG/Boundary Scan hardware platform SCANFLEX supports SPEA 4040 Highline/Multimode tester of the type Flying Probe.

With this Boundary Scan implementation, a multitude of additional test options is available for the users on board and system level over the complete product life cycle without invasive access of the nail bed. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

One highlight is the possibility of carrying out interactive tests between Boundary Scan IC and Flying Probes. The software SYSTEM CASCON™ controls the positioning of the probes and uses the functions for driving and measuring the signal levels.

The tester platform of SPEA’s 4040 series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.