JTAG/Boundary Scan Integration in Rohde & Schwarz series
Rohde & Schwarz TSVP
The JTAG/Boundary Scan hardware platform SCANFLEX® supports multi configurational and/or multi functional ATE systems of Rohde & Schwarz testers series TSVP.
The integrated Boundary Scan hardware for the TSVP systems consists of a PXI compact controller with paddle card and the TAP Interface Card TIC02SR.
The architecture of the controller supports data rates up to 80 MHz at up to eight independent TAP with additional resources.
Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.
Integration example for Rohde & Schwarz TSVP Tester
Combination of the multi functional PXI testers TSVP by Rohde & Schwarz with SCANFLEX hardware Controller PXI Compact Version 4TAP and TAP Interface Card TIC02SR including GOEPEL electronic’s software CASCON GALAXY 4.5x.
Rohde & Schwarz TSx
The JTAG/Boundary Scan hardware platform SCANFLEX® supports multi configurational and/or multi functional ATE systems of Rohde & Schwarz testers series TSx.
The integrated Boundary Scan hardware for the conventional TSI/TSA In-Circuit test series consists of a PCI controller, a Fixture TAP Transceiver and the TAP Interface Card TIC02SR.
The architecture of the controller supports data rates up to 80 MHz at up to eight independent TAP with additional resources.
Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.
JTAG/Boundary Scan Integration in Rohde & Schwarz series
Rohde & Schwarz TSVP
The JTAG/Boundary Scan hardware platform SCANFLEX® supports multi configurational and/or multi functional ATE systems of Rohde & Schwarz testers series TSVP.
The integrated Boundary Scan hardware for the TSVP systems consists of a PXI compact controller with paddle card and the TAP Interface Card TIC02SR.
The architecture of the controller supports data rates up to 80 MHz at up to eight independent TAP with additional resources.
Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.
Integration example for Rohde & Schwarz TSVP Tester
Combination of the multi functional PXI testers TSVP by Rohde & Schwarz with SCANFLEX hardware Controller PXI Compact Version 4TAP and TAP Interface Card TIC02SR including GOEPEL electronic’s software CASCON GALAXY 4.5x.
Rohde & Schwarz TSx
The JTAG/Boundary Scan hardware platform SCANFLEX® supports multi configurational and/or multi functional ATE systems of Rohde & Schwarz testers series TSx.
The integrated Boundary Scan hardware for the conventional TSI/TSA In-Circuit test series consists of a PCI controller, a Fixture TAP Transceiver and the TAP Interface Card TIC02SR.
The architecture of the controller supports data rates up to 80 MHz at up to eight independent TAP with additional resources.
Besides the tremendously increased test coverage, a significant cost reduction and a reduced time-to-market are further advantages.
