Integration in Aeroflex Series

The SCANFLEX JTAG/Boundary Scan hardware supports the Aeroflex 4200, 5200 and 5300 series of In-Circuit and Functional ATE systems.

With this Boundary Scan implementation, a multitude of additional test options is available for the users on board and system level over the complete product life cycle without invasive access of the nail bed. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.

Aeroflex’ tester platform supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY® software.

The SCANFLEX JTAG/Boundary Scan hardware supports the Aeroflex 5800 series of multi- configurable and multi-functional ATE systems.

The integrated Boundary Scan hardware consists of a controller (PXI, PCI or USB), a TAP transceiver, a TAP Interface Card (TIC), and several I/O modules. Due to the application of digital I/O modules the test coverage of the 5800 Series ATE test systems can be increased. The architecture of the controller supports data rates up to 80 MHz at up to eight independent TAP. As well as the increased test coverage, further advantages are a significant cost reduction and a reduced time-to-market.
The test platform of Aeroflex’s 5800 series supports the true reusability of all JTAG/Boundary Scan test and programming procedures that were generated by GOEPEL electronic’s CASCON GALAXY software.

In addition, the 5800 series Digital Test Points (DTP) can be directly controlled by the SCANFLEX hardware, forming an integral part of the Boundary Scan chain and allowing additional parallel access to the UUT.