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JTAG/Boundary Scan
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Type of Application for JTAG/Boundary Scan

Find your appropriate application

Each application pursues certain basic objectives, such as testing, programming, debugging or validation.

It is defined by certain very specific characteristics, such as execution speed, execution environment or interaction with other instruments.

Our JTAG/Boundary Scan platform supports not only all of the above mentioned applications, but also offers the option to interactively combine other access methods through open system integration.

In this context, the following application types are especially important for Embedded System Access (ESA).

Application type Key application contents
Structural test More about Structural test Checking the proper connection between the various circuitry elements
Functional test Checking the proper functioning of ICs, clusters, boards, interfaces and systems
Emulation test Test conducted by the micro processor through emulation
(special instance of functional test)
At-speed-test Execution: structural, functional or emulation test at higher speed
Real time test Execution: structural, functional or emulation test at nominal speed
Analog measurement Measurement of voltage, frequency, temperature, waveform
Debugging Interactive test of individual registers, pins, connections or logic functions
Programming Programming of non-volatile memory (flash, micro controller, PLD)