Find your appropriate application
Each application pursues certain basic objectives, such as testing, programming, debugging or validation.
It is defined by certain very specific characteristics, such as execution speed, execution environment or interaction with other instruments.
Our JTAG/Boundary Scan platform supports not only all of the above mentioned applications, but also offers the option to interactively combine other access methods through open system integration.
In this context, the following application types are especially important for Embedded System Access (ESA).
|Application type||Key application contents|
|Structural test||Checking the proper connection between the various circuitry elements|
|Functional test||Checking the proper functioning of ICs, clusters, boards, interfaces and systems|
|Emulation test||Test conducted by the micro processor through emulation
(special instance of functional test)
|At-speed-test||Execution: structural, functional or emulation test at higher speed|
|Real time test||Execution: structural, functional or emulation test at nominal speed|
|Analog measurement||Measurement of voltage, frequency, temperature, waveform|
|Debugging||Interactive test of individual registers, pins, connections or logic functions|
|Programming||Programming of non-volatile memory (flash, micro controller, PLD)|